US2013154681A1PendingUtilityA1

Substrate inspection jig and substrate inspection method

Assignee: MIYANISHI KEISHIPriority: Jun 6, 2011Filed: Dec 14, 2012Published: Jun 20, 2013
Est. expiryJun 6, 2031(~4.8 yrs left)· nominal 20-yr term from priority
G01R 1/0408
33
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Claims

Abstract

A substrate inspection jig for use in inspection of an electrical property of a printed board to be inspected on which an electronic component is mounted includes a spacer which is mounted on the printed board to be inspected, a conductive plate which is connected to the spacer, and is disposed along an arrangement direction of electrode terminals of the electronic component to be inspected, and a fastener which fastens the spacer on the printed board to be inspected, wherein the plate is disposed above the printed board to be inspected so as to avoid contact with the printed board to be inspected, and a predetermined potential of the printed board to be inspected is set to the plate through the spacer or/and the fastener.

Claims

exact text as granted — not AI-modified
What is claimed is: 
     
         1 . A substrate inspection jig for use in inspection of an electrical property of a printed board to be inspected on which an electronic component is mounted, comprising:
 a spacer which is mounted on the printed board to be inspected;   a conductive plate which is connected to the spacer, and is disposed along an arrangement direction of electrode terminals of the electronic component to be inspected; and   a fastener which fastens the spacer on the printed board to be inspected,   wherein the plate is disposed above the printed board to be inspected so as to avoid contact with the printed board to be inspected, and a predetermined potential of the printed board to be inspected is set to the plate through the spacer or/and the fastener.   
     
     
         2 . The substrate inspection jig according to  claim 1 , wherein the spacer has a conductive property, and has contact with a land portion having a reference potential on the printed board to be inspected. 
     
     
         3 . The substrate inspection jig according to  claim 1 , wherein
 the spacer includes on an outer periphery thereof a male screw,   the male screw is threadably mounted on a female screw formed in the plate, and   a height of the threadably mounted plate from the printed board to be inspected is adjusted by rotating the spacer.   
     
     
         4 . The substrate inspection jig according to  claim 1 , wherein the spacer is disposed on both end sides relative to the plate. 
     
     
         5 . The substrate inspection jig according to  claim 1 , wherein
 the fastener includes a metal screw which is threadably mounted on a female screw formed in the spacer through a hole from a back surface opposite to a surface provided with the electronic component of the printed board to be inspected, so as to fasten the spacer on the printed board to be inspected, and   a head portion of the metal screw has contact with a land portion having a reference potential formed around the hole on the back surface of the printed board to be inspected, so that a potential of the plate is set through the spacer or the head portion of the metal screw has direct contact with the plate, so that the potential of the plate is set.   
     
     
         6 . The substrate inspection jig according to  claim 1 , wherein
 the plate includes a plate fastener electrically connected to the spacer, a conductive guide section having an end portion connected to the plate fastener, and disposed along the arrangement direction of the electrode terminals of the electronic component, a conductive substantially cuboid plate-moving section which is movable along the arrangement direction of the electrode terminals by sliding the guide section, and a plate-locking section which locks the plate-moving section to the guide section in an arbitrary position.   
     
     
         7 . The substrate inspection jig according to  claim 1 , wherein
 the plate includes a plate fastener electrically connected to the spacer, a conductive guide section having an end portion connected to penetrate through the plate fastener, and disposed along the arrangement direction of the electrode terminals of the electronic component, a conductive substantially cuboid plate-moving section which is movable along the arrangement direction of the electrode terminals by sliding the guide member, a plate-locking section which locks the plate-moving section to the guide section in an arbitrary position, and a guide locking section which locks the guide section to the plate fastener in an arbitrary position.   
     
     
         8 . The substrate inspection jig according to  claim 6 , wherein
 the plate fastener is disposed such that at least two guide sections are orthogonal to each other, and   the two guide sections are held in the plate fastener disposed to face a corner portion of two orthogonal sides of the electronic component to be inspected, so that the plate-moving section is movable along the two sides.   
     
     
         9 . The substrate inspection jig according to  claim 8 , wherein the plate fastener is disposed in a square shape such that the guide sections are orthogonal to each other relative to each plate fastener disposed corresponding to four corner portions of the electronic component to be inspected, so that the plate-moving section is movable along four sides of the electronic component. 
     
     
         10 . The substrate inspection jig according to any one of  claim 6 , wherein a plurality of grooves each having a predetermined width is arranged in a corner portion of an upper portion on a side facing the electrode terminals of the electrode component in the plate-moving section according to pitches of the electrode terminals along the guide section sliding direction. 
     
     
         11 . The substrate inspection jig according to  claim 10 , wherein grooves having pitches different from the pitches of the grooves formed in the corner portion of the upper portion in the plate-moving section are formed in a corner portion of a lower portion on the side facing the electrode terminals of the electronic component in the plate-moving section along the guide section sliding direction. 
     
     
         12 . The substrate inspection jig according to  claim 10 , wherein one end of the groove opens at the corner portion and the other end of the groove is grooved at a predetermined length from the corner portion in the direction orthogonal to the guide section sliding direction. 
     
     
         13 . A substrate inspection method of inspecting an electrical property of a printed board to be inspected on which an electronic component is mounted, comprising the steps of
 preparing a substrate inspection jig including a spacer which is mounted on the printed board to be inspected, a conductive plate which is connected to the spacer and is disposed along an arrangement direction of electrode terminals of the electronic component, and a fastener which fastens the spacer on the printed board to be inspected,   disposing the plate above the printed board to be inspected so as to avoid contact with the printed board to be inspected, and setting a predetermined potential of the printed board to be inspected to the plate through the spacer and/or the fastener by using the substrate inspection jig, and   inspecting the electronic property of the printed board to be inspected with a potential of the plate as a reference.   
     
     
         14 . A substrate inspection method of inspecting an electrical property of a printed board to be inspected on which an electronic component is mounted, comprising:
 a step of attaching the substrate inspection jig according to  claim 1  on the printed board to be inspected,   a step of inspecting the electrical property of the printed board to be inspected with a potential of the plate as a reference, and   a step of removing the printed board to be inspected from the substrate inspection jig after the inspection.

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