System and method for testing fans

Abstract

A fan test system includes a control module. The control module includes a temperature-speed table storing standard speeds at different temperatures of a fan, a counter loaded with a default value, and a fan speed control unit setting the time interval for obtaining the actual speed of a fan corresponding to a certain temperature. The fan speed control unit obtains the actual speed of the fan at every interval time, and determines whether the speeds obtained at predetermined continuous interval times are equal. The fan speed control unit obtains the standard speed of the fan according to the certain temperature if the speeds are equal. It indicates the fan is qualified in response to the actual speed being equal to the standard speed.

What is claimed is: 
     
         1 . A test system for a fan, comprising:
 a control module transmitting a pulse width modulation signal to a pulse pin of the fan according to a certain temperature, and obtaining the actual speed of the fan, the control module comprises:   a storage unit storing a temperature-speed table, wherein the temperature-speed table containing the standard speeds of the fan corresponding to different temperatures;   a counter loaded with a default value; and   a fan speed control unit setting a time interval for obtaining the actual speed of the fan;   wherein the fan speed control unit obtains the actual speed of the fan at every time interval, and obtains the standard speed of the fan according to the certain temperature in response to the actual speeds of the fan being equal at predetermined continuous time intervals summed to the default value of the counter, thereby to represent the fan is qualified in response to the actual speed being equal to the standard speed.   
     
     
         2 . The test system of  claim 1 , further comprising an alarm circuit, wherein the alarm circuit comprises a light-emitting diode, an anode of the light-emitting diode is coupled to the control module, a cathode of the light-emitting diode is grounded, the fan speed control unit transmits an alarm signal to the alarm circuit to make the light-emitting diode emit light in response to the actual speed being not equal to the standard speed. 
     
     
         3 . The test system of  claim 1 , wherein the control module is a baseboard management controller. 
     
     
         4 . A test method for a fan, comprising:
 setting a certain temperature, a default value of a counter, and a time interval for obtaining an actual speed of the fan;   obtaining a first actual speed of the fan corresponding to a first temperature, and setting the first actual speed as a first speed;   obtaining a second actual speed of the fan at every time interval, and setting the second actual speed as a second speed;   determining whether the first speed is equal to the second speed;   decreasing the counter by  1  in response to the first speed equaling to the second speed;   setting the counter to the default value, and setting the second speed as the first speed in response to the first speed being not equal to the second speed;   determining whether the counter is equal to  0 ;   obtaining the standard speed of the fan from a temperature-speed table according to the certain temperature in response to the counter being  0 ;   determining whether the actual speed is equal to the standard speed; and   indicating the fan is qualified in response to the actual speed equaling to the standard speed.   
     
     
         5 . The test method of  claim 4 , further comprising:
 delivering an alarm signal to an alarm circuit to alarm in response to the actual speed being not equal to the standard speed.   
     
     
         6 . The test method of  claim 5 , wherein the alarm circuit comprises a light-emitting diode, an anode of the light-emitting diode is employed to receive the alarm signal, a cathode of the light-emitting diode is grounded, the light-emitting diode emits light in response to receiving the alarm signal. 
     
     
         7 . The test method of  claim 4 , wherein the temperature-speed table is stored in a storage unit.