US2013082402A1PendingUtilityA1
Semiconductor device
Est. expiryFeb 18, 2025(expired)· nominal 20-yr term from priority
H10W 90/754H10W 90/734H10W 90/732H10W 90/724H10W 74/117H10W 74/00H10W 72/9415H10W 72/9223H10W 72/952H10W 72/923H10W 72/922H10W 72/884H10W 72/877H10W 70/656H10W 70/655H10W 90/701H10W 90/00H10W 70/635H10W 70/611H10W 44/20H10W 42/20H10W 72/926H10W 72/9445H10W 72/936H10W 72/29H10W 70/60H10W 72/242H10W 20/42H10W 72/20H10W 72/90H01L 23/49827
53
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Claims
Abstract
A semiconductor device is disclosed that includes a support substrate, a first semiconductor element that is mounted on one side of the support substrate, a second semiconductor element including a high frequency electrode that is mounted on the one side of the support substrate, a via hole that is provided at the support substrate in relation to the high frequency electrode, and an external connection electrode that is provided on the other side of the support substrate in relation to the via hole.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A semiconductor device comprising:
a substrate; a first semiconductor element that is mounted on one side of the substrate; a second semiconductor element including a first electrode that is mounted on the one side of the substrate; a second electrode that is provided on the other side of the substrate connects to the first electrode with a via hole that penetrates through the substrate; wherein the first electrode is positioned within a periphery of the via hole; the second semiconductor element includes rewiring that forms a passive element; and the substrate and the first semiconductor and the second semiconductor are integrally sealed by molded resin.
2 . The semiconductor device as claimed in claim 1 , wherein
the first semiconductor element is stacked on the second semiconductor element.
3 . The semiconductor device as claimed in claim 1 , wherein
the second semiconductor element includes a shield member that is set to ground potential.
4 . The semiconductor device as claimed in claim 1 , wherein
the second semiconductor element includes a pair of re-wiring structures that include portions that are parallel to each other.
5 . The semiconductor device as claimed in claim 1 , wherein
the second semiconductor element includes a set of re-wiring structures that have substantially equivalent wiring lengths.
6 . The semiconductor device as claimed in claim 1 , wherein the via hole related to the first electrode has a diameter larger than a diameter of a second via hole connected to a third electrode an external connection terminal provided on an electrode pad of the second semiconductor element other than the first electrode; and
the diameter of the via hole related to the first electrode is larger than a diameter of the external connection electrode of the second semiconductor element connecting to the via hole related to the first electrode.Join the waitlist — get patent alerts
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