US2013047129A1PendingUtilityA1

Staged Scenario Generation

Assignee: LSI CORPPriority: Dec 3, 2007Filed: Oct 23, 2012Published: Feb 21, 2013
Est. expiryDec 3, 2027(~1.3 yrs left)· nominal 20-yr term from priority
G06F 30/398
38
PatentIndex Score
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Claims

Abstract

A method of verifying integrated circuit designs, by constructing a series of atomic generators in a staged, hierarchical order, applying a lowest of the hierarchical generator stages to device level test cases of the verification process, applying a highest of the hierarchical generator stages to system level test cases of the verification process, reusing code written for and used in the lowest hierarchical generator stage in a next higher generator stage, creating a constraint scenario in the highest hierarchical generator stage, and injecting the constraint scenario into a next lower generator stage.

Claims

exact text as granted — not AI-modified
1 . An integrated circuit design verification generator comprising program elements residing on a non-transitory computer-readable storage-medium, the program elements enabling the computer to cause the generator to:
 selectively generate a random verification scenario,   selectively receive a verification scenario that is injected from a higher stage level generator,   decode the verification scenario and generate a sequence of lower level scenarios using a callback mechanism, where for each verification scenario, a callback is added that can decode the verification scenario and generate the sequence of lower level scenarios, and   selectively inject the sequence of lower level scenarios into a lower stage level generator.

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