US2013043567A1PendingUtilityA1

Method For Forming Silicon Film, Method For Forming PN Junction And PN Junction Formed Using The Same

Assignee: SAMSUNG ELECTRONICS CO LTDPriority: Jan 23, 2009Filed: Oct 23, 2012Published: Feb 21, 2013
Est. expiryJan 23, 2029(~2.5 yrs left)· nominal 20-yr term from priority
H10P 14/3411H10P 14/2923H10P 14/2922H10P 14/24H10P 14/3441C23C 16/24
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Claims

Abstract

A method for forming a silicon film may be performed using a microheater including a substrate and a metal pattern spaced apart from the substrate. The silicon film may be formed on the metal pattern by applying a voltage to the metal pattern of the microheater to heat the metal pattern and by exposing the microheater to a source gas containing silicon. The silicon film may be made of polycrystalline silicon. A method for forming a pn junction may be performed using a microheater including a substrate, a conductive layer on the substrate, and a metal pattern spaced apart from the substrate. The pn junction may be formed between the metal pattern and the conductive layer by applying a voltage to the metal pattern of the microheater to heat the metal pattern. The pn junction may be made of polycrystalline silicon.

Claims

exact text as granted — not AI-modified
1 . A pn junction, comprising:
 a microheater including a substrate, a conductive layer on the substrate, and a metal pattern spaced apart from the substrate; and   a first doped layer and a second doped layer between the conductive layer and the metal pattern,   wherein at least one of the first doped layer and the second doped layer is grown on the metal pattern.   
     
     
         2 . The pn junction according to  claim 1 , further comprising:
 an intrinsic layer between the first doped layer and the second doped layer.   
     
     
         3 . The pn junction according to  claim 1 , wherein
 the first doped layer comprises a plurality of first doped layers spaced apart from each other, and   the second doped layer comprises at least one second doped layer positioned between the plurality of first doped layers.

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