Method and apparatus for inspecting biological samples

Abstract

A method of selecting for analysis a sample of a biological material anisotropically distributed on a substrate is disclosed, comprising the steps of directing a beam of radiation onto the substrate, said radiation being selected to interact with the biological material to an extent corresponding to the anisotropy; measuring the interaction at plurality of locations; and selecting the sample by reference to the measurements. An inspection apparatus for selecting for analysis a sample of a biological material anisotropically distributed on a substrate is disclosed comprising a source of radiation selected to interact with the anisotropically distributed biological material to an extent corresponding to the anisotropy; a detector for measuring the interaction at plurality of locations on the substrate; and a processor coupled to the detector for utilizing the measurement to select a portion of the sample for further analysis.

1 - 34 . (canceled) 
     
     
         35 . An inspection apparatus for selecting for analysis a sample of a biological material anisotropically distributed on a substrate, said apparatus comprising:
 a source of radiation selected to direct a beam of radiation onto said substrate, said radiation being selected to interact with said anisotropically distributed biological material to an extent corresponding to said anisotropy;   a detector configured to provide a measurement of said interaction at plurality of locations on said substrate; and   a processor coupled to the detector for utilizing the measurement at each of said plurality of locations to select a portion of said sample for further analysis.   
     
     
         36 . The apparatus of  claim 35  wherein the processor is configured to determine the suitability of the sample for further analysis. 
     
     
         37 . The apparatus of  claim 35  wherein the source of radiation is a first light source and the detector is configured to measure the intensity of light. 
     
     
         38 . The apparatus of  claim 37  further comprising:
 a second light source disposed in lateral relation with said detector, wherein light reflected from the sample may be measured by the detector; and 
 a light barrier placed between the second light source and the adjacent detector. 
 
     
     
         39 . The apparatus of  claim 37  wherein the first light source comprises a light emitting diode (LED). 
     
     
         40 . The apparatus of  claim 37  wherein the detector is a photo-electric device configured to measure the intensity of light incident at a plurality of pixels, and wherein measurements are made at a plurality of predetermined locations corresponding to said respective pixels. 
     
     
         41 . The apparatus of  claim 35  further comprising a focusing arrangement configured for focusing reflected or transmitted radiation onto the detector. 
     
     
         42 . The apparatus of  claim 41  wherein the focusing arrangement comprises a lens. 
     
     
         43 . The apparatus of  claim 35  wherein the support member has a substantially C-shaped section wherein the source and the detector are fixed to respective opposing ends of the C-shaped section. 
     
     
         44 . The apparatus of  claim 35  further comprising a radiation director for directing electromagnetic radiation emanating from said source or radiation. 
     
     
         45 . The apparatus of  claim 44  wherein the radiation director comprises an aperture. 
     
     
         46 . The apparatus of  claim 45  wherein the size of the aperture corresponds to a desired size of said portion of the sample. 
     
     
         47 . The apparatus of  claim 44  wherein the radiation director comprises a series of mirrors. 
     
     
         48 . The apparatus of  claim 44  wherein the radiation director comprises an optical fiber. 
     
     
         49 . The apparatus of  claim 44  wherein the radiation director and the detector are fixed to a common support member that is movable relative to said substrate. 
     
     
         50 . The apparatus of  claim 49  wherein the support member has a substantially C-shaped section and wherein the source and director combination and the detector are fixed to respective opposing ends of the C-shaped section. 
     
     
         51 . The apparatus of  claim 49  wherein the source and radiation director combination and the light detector are located adjacent to one another on the support member, whereby light reflected from an obverse face of the substrate may be detected. 
     
     
         52 . The apparatus of  claim 51  wherein the detector is placed adjacent to a reverse face of the substrate. 
     
     
         53 . The apparatus of  claim 52  wherein the detector is disposed opposite to the direction of the electromagnetic radiation incident on said obverse face of the substrate. 
     
     
         54 . The apparatus of  claim 35  further comprising a sampling apparatus for removing said portion of the sample from the substrate.