US2013010165A1PendingUtilityA1
Optical micro structure, method for fabricating the same and applications thereof
Assignee: UNITED MICROELECTRONICS CORPPriority: Jul 5, 2011Filed: Jul 5, 2011Published: Jan 10, 2013
Est. expiryJul 5, 2031(~4.9 yrs left)· nominal 20-yr term from priority
Inventors:Cheng-Hung Yu
H10F 39/8063H10F 39/806H10F 39/804H10F 39/024Y10T29/49
62
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Claims
Abstract
An image sensor comprises a plurality of color filtering elements, a plurality of lenses and an image sensing device, wherein the lenses are correspondingly formed over the color filtering elements, and the image sensing device having a sensing area engaged with the color filtering elements.
Claims
exact text as granted — not AI-modified1 . An image sensor, comprising:
a plurality of color filtering elements; a plurality of lenses correspondingly formed over the color filtering elements; and an image sensing device having a sensing area engaged with the color filtering elements.
2 . The image sensor of claim 1 , wherein the color filtering elements are buried in a dielectric layer of the sensing area and with a deepness extending beyond a bottom metal which is disposed in the dielectric layer and adjacent to the sensing area.
3 . The image sensor of claim 1 , further comprising a planarization layer disposed between the plurality of lenses and the plurality of color filtering elements.
4 . The image sensor of claim 1 , wherein the color filtering elements are contiguously disposed on a backside of the image sensing device.
5 . The image sensor of claim 1 , wherein the image sensor has a wafer-scale structure which can be cut into a plurality of image sensing chips.
6 . The image sensor of claim 1 , further comprising:
a working substrate; and a transparent substrate disposed on the working substrate, wherein the transparent substrate has a plurality of recesses allowing the lenses correspondingly embedded in the recesses.
7 . The image sensor of claim 1 , wherein the image sensor further comprises a passive layer disposed on the transparent substrate opposite to the lenses.
8 . A method for fabricating an image sensor, comprising:
forming a transparent substrate on a working substrate; forming pluralities of micro lens in the transparent substrate, wherein the lenses have a refraction ratio differing from that of the transparent substrate; forming a color filter on the lenses; and engaging the color filter with an image sensing device by flipping the working substrate.
9 . The method for fabricating the image sensor of claim 8 , wherein the engagement of the color filter and the image sensing device comprises steps of:
forming a concave portion in the sensing area; and contiguously disposing the color filter to a bottom of the concave portion.
10 . The method for fabricating the image sensor of claim 8 , wherein the engagement of the color filter and the image sensing device comprises steps of disposing the color filter contiguously to a backside of the image sensing device.
11 . The method for fabricating the image sensor of claim 8 , wherein the formation of the color filter comprises steps of forming a plurality of color filtering elements over and corresponding to the lenses.
12 . The method for fabricating the image sensor of claim 8 , wherein the formation of the color filter comprises steps of forming a planarization layer overlying the lenses, and forming a plurality of color filtering elements overlying the planarization layer.
13 . The method for fabricating the image sensor of claim 8 , further comprising planarizing the working substrate, whereby the remaining working substrate can serve as a passive layer to protect the color filter, after the color filter is engaged with the image sensing device.
14 . The method for fabricating the image sensor of claim 8 , wherein after the color filter is engaged with the image sensing device, further comprising
removing the working substrate; and forming a passive layer on the transparent substrate opposite to the lenses.
15 . A method for fabricating an image sensor, comprising:
providing a color filter wafer having a plurality of color filters; providing an image sensor wafer having a plurality of image sensing devices, wherein each of the image sensing device has a sensing area corresponding to one of the color filters; and engaging the color filter wafer with the image sensor wafer to make each of the color filter buried in a dielectric layer of the sensing area with a deepness extending beyond a bottom metal disposed in the dielectric layer and adjacent to the sensing area.
16 . The method for fabricating the image sensor of claim 15 , wherein after the color filter wafer and the image sensor wafer are engaged, a wafer sawing process is carried out to cut the engaged color filter wafer and the image sensor wafer into a plurality of image sensing chips each at least comprises one of the micro lens, one of the image sensing devices and one of the color filters.Join the waitlist — get patent alerts
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