US2012286815A1PendingUtilityA1

Inspection Device Applying Probe Contact for Signal Transmission

Assignee: CHEN CHIAN-JUNGPriority: May 12, 2011Filed: Sep 23, 2011Published: Nov 15, 2012
Est. expiryMay 12, 2031(~4.8 yrs left)· nominal 20-yr term from priority
H04M 1/04H04M 1/24G01R 1/0408
42
PatentIndex Score
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Claims

Abstract

An inspection device applying probe contact for signal transmission includes an inspection panel board; a probe base disposed on the inspection panel board and having a plurality of probes; a receiving moldboard disposed on the inspection panel board and including a fillister for receiving inspected portable electronic apparatus, and an open slot allocated facing the plurality of probes of the probe base, thereby enabling the plurality of probes to contact with corresponding signal terminals of the portable electronic apparatus; and a clamp unit disposed on the inspection panel board and consisting of an adjustable rod and a clamp block allocated at one end of the adjustable rod, the adjustable rod adjusting position of the clamp block, thereby clamping and properly positioning the portable electronic apparatus in the receiving moldboard.

Claims

exact text as granted — not AI-modified
1 . An inspection device applying probe contact for signal transmission, comprising:
 an inspection panel board;   a probe base disposed on the inspection panel board and comprising a plurality of probes;   a receiving moldboard disposed on the inspection panel board and comprising a fillister for receiving an inspected portable electronic apparatus therein, and an open slot facing the plurality of probes of the probe base for the plurality of probes to contact with corresponding signal terminals of the inspected portable electronic apparatus; and   a clamp unit disposed on the inspection panel board and comprising an adjustable rod and a clamp block disposed at one end of the adjustable rod, the adjustable rod adjusting a position of the clamp block for clamping and positioning the portable electronic apparatus received in the receiving moldboard.   
     
     
         2 . The inspection device of  claim 1 , wherein the receiving moldboard comprises a plurality of guiding rods disposed on a periphery of the fillister. 
     
     
         3 . The inspection device of  claim 2 , wherein a level gap exists between the guiding rods and the fillister. 
     
     
         4 . The inspection device of  claim 1 , further comprising a rotary cylinder for controlling the adjustable rod to be adjusted to a predetermined status, thereby enabling the clamp block to clamp and position the portable electronic apparatus received in the receiving moldboard. 
     
     
         5 . The inspection device of  claim 1 , wherein the fillister comprises a power supply open chamber for containing a power supply module, and the power supply module is for providing the portable electronic apparatus with needed power. 
     
     
         6 . The inspection device of  claim 5 , wherein the power supply module is a charging circuit board. 
     
     
         7 . The inspection device of  claim 5 , wherein a driving cylinder is disposed on another side of the inspection panel board opposing to the side whereon the probe base, the receiving moldboard, and clamp unit are disposed, and the driving cylinder is for controlling the power supply module to come out from the power supply open chamber, thereby enabling a power supply part of the power supply module to contact with a power supply terminal of the portable electronic apparatus in the receiving moldboard. 
     
     
         8 . The inspection device of  claim 1 , further comprising a driving cylinder and a guiding track both disposed on the inspection panel board, the driving cylinder enabling the probe base to move on along the guiding track, and enabling the plurality of probes to slide in or out of the fillister of the receiving moldboard. 
     
     
         9 . The inspection device of  claim 1 , further comprising a clamp and a guiding track, the clamp allowing the probe base to move on along the guiding track, thereby enabling the plurality of probes to slide in or out of the fillister of the receiving moldboard. 
     
     
         10 . The inspection device of  claim 1 , wherein the receiving moldboard is made of Polyoxymethylene (POM), or the receiving moldboard is plated with Polytetrafluoroethene (PTFE). 
     
     
         11 . The inspection device of  claim 1 , wherein the clamp block comprises a clamping part for clamping a housing of the portable electronic apparatus.

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