US2012138665A1PendingUtilityA1
Method for fabricating optical semiconductor device
Est. expiryDec 3, 2030(~4.4 yrs left)· nominal 20-yr term from priority
Inventors:Yoshiki Oka
B23K 35/3013B23K 35/262H01S 5/042B23K 1/0016B23K 3/0623B23K 3/087H01S 5/02355
44
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Claims
Abstract
A method for fabricating an optical semiconductor device, including: melting a solder supplied on a carrier; mounting a semiconductor laser chip on the melted solder with a tool for holding the semiconductor laser chip; cooling the solder; releasing the tool from the semiconductor laser chip after the solder is cooled; remelting the solder after the tool is released from the semiconductor laser chip; and recooling the remelted solder.
Claims
exact text as granted — not AI-modified1 . A method for fabricating an optical semiconductor device, comprising:
melting a solder supplied on a carrier; mounting a semiconductor laser chip on the melted solder with a tool for holding the semiconductor laser chip; cooling the solder; releasing the tool from the semiconductor laser chip after the solder is cooled; remelting the solder after the tool is released from the semiconductor laser chip; and recooling the remelted solder.
2 . The method for fabricating the optical semiconductor device according to claim 1 , wherein the cooling is natural cooling.
3 . The method for fabricating the optical semiconductor device according to claim 1 , wherein the cooling is cooling by blowing gas.
4 . The method for fabricating the optical semiconductor device according to claim 1 , wherein the carrier includes a mounted region on which the semiconductor laser chip is mounted, and a solder accumulation portion that extends in a direction intersecting a longitudinal direction of the mounted region.
5 . The method for fabricating the optical semiconductor device according to claim 1 , wherein a length of the longitudinal direction of the semiconductor laser chip is equal to or more than 6 times of a width thereof.
6 . The method for fabricating the optical semiconductor device according to claim 1 , wherein a long side of the semiconductor laser chip is equal to or more than 3.0 mm.
7 . The method for fabricating the optical semiconductor device according to claim 1 , wherein a metal of a backside of the semiconductor laser chip is Au, and a temperature of the remelting is higher than a temperature of the mounting of the semiconductor laser.
8 . The method for fabricating the optical semiconductor device according to claim 1 , wherein the solder is AuSn, a melting temperature and a remelting temperature are 310-320° C., and a interval between the mounting of the semiconductor laser chip and startup of the cooling is equal to or less than 3 seconds.
9 . A method for fabricating an optical semiconductor device, comprising:
melting a solder supplied on a carrier; mounting a semiconductor laser chip on the melted solder with a tool for holding the semiconductor laser chip, a length of the longitudinal direction of the semiconductor laser chip being equal to or more than 6 times of a width thereof; releasing the tool from the semiconductor laser chip in a state where the solder is melted; and cooling the solder in a state where the tool is released from the semiconductor laser chip.
10 . The method for fabricating the optical semiconductor device according to claim 9 , wherein a long side of the semiconductor laser chip is equal to or more than 3.0 mm.
11 . The method for fabricating the optical semiconductor device according to claim 1 , wherein the semiconductor laser chip is a tunable laser.
12 . The method for fabricating the optical semiconductor device according to claim 1 , wherein the tool is in contact with a surface of a region excluding a stripe-like active region in the semiconductor laser chip, and holds the semiconductor laser chip.
13 . The method for fabricating the optical semiconductor device according to claim 1 , wherein the melting is carried out by placing the carrier on a heater block.
14 . The method for fabricating the optical semiconductor device according to claim 1 , wherein the solder is AuSn, AuGe or AgSn.
15 . The method for fabricating the optical semiconductor device according to claim 2 , wherein the natural cooling is carried out by placing the carrier on a heat sink.
16 . The method for fabricating the optical semiconductor device according to claim 3 , wherein the gas is nitrogen gas.
17 . The method for fabricating the optical semiconductor device according to claim 4 , wherein the solder accumulation portion is a center portion in the direction intersecting the longitudinal direction of the mounted region.
18 . The method for fabricating the optical semiconductor device according to claim 4 , wherein the solder accumulation portion is rectangle.
19 . The method for fabricating the optical semiconductor device according to claim 9 , wherein the solder is AuSn, AuGe or AgSn.
20 . The method for fabricating the optical semiconductor device according to claim 9 , wherein the melting is carried out by placing the carrier on a heater block.Join the waitlist — get patent alerts
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