Micrometric direct-write methods for patterning conductive material and applications to flat panel display repair
Abstract
A method for direct-write patterning comprises providing a cantilever having a cantilever end, wherein the cantilever is a tipless cantilever; providing an ink disposed at the cantilever end; providing a substrate surface; and moving the cantilever end or moving the substrate surface so that ink is delivered from the cantilever end to the substrate surface. A method for direct writing of conductive metal or metal precursor comprises providing a tipless cantilever having a cantilever end; providing an ink disposed at the cantilever end, wherein the ink comprises one or more metals, one or more metallic nanoparticles, or one or more metal salts; providing a substrate surface; and contacting the cantilever end and the substrate surface so that ink is delivered from the cantilever end to the substrate surface.
Claims
exact text as granted — not AI-modified1 . A method comprising
providing a cantilever having a cantilever end, wherein the cantilever is a tipless cantilever; providing an ink disposed at the cantilever end; providing a substrate surface; moving the cantilever end or moving the substrate surface so that ink is delivered from the cantilever end to the substrate surface.
2 . The method according to claim 1 , wherein the substrate surface is moved and the cantilever is stationary.
3 . The method according to claim 1 , wherein the substrate surface is stationary and the cantilever is moved.
4 . The method according to claim 1 , wherein the substrate is a flat panel display substrate.
5 . The method according to claim 1 , wherein the ink comprises one or more metals, metal salts, or metal nanoparticles.
6 . The method according to claim 1 , wherein the ink comprises one or more solvents having a boiling point over 100° C.
7 . The method according to claim 1 , wherein the ink forms a feature on the substrate surface which has a dimension controlled by the geometry of the cantilever.
8 . The method according to claim 1 , wherein the ink forms a feature on the substrate surface which has a width of about one micron to about 100 microns.
9 . The method according to claim 1 , wherein the ink forms a feature on the substrate surface and the feature is subjected to fusion, sintering, or coalescence conditions.
10 . The method according to claim 1 , wherein the ink forms a feature on the substrate surface and the feature is subjected to annealing.
11 . The method according to claim 1 , wherein the ink forms a feature on the substrate surface and the feature is subjected to light.
12 . The method according to claim 1 , wherein the ink forms a feature on the substrate surface and the feature is subjected to laser curing.
13 . The method according to claim 1 , wherein the ink forms a feature on the substrate surface which is made continuous after contacting.
14 . The method according to claim 1 , wherein the ink forms a feature on the substrate surface which is converted to a metallic state which has a resistivity of about 10 microohm.cm or less.
15 . The method according to claim 1 , wherein the ink forms a feature on the substrate surface which has a width of about 5 nm to about one micron.
16 . The method according to claim 1 , wherein the method is repeated to form layers of ink on the substrate surface.
17 . The method according to claim 1 , wherein the cantilever comprises an ink storage slit or channel.
18 . The method according to claim 1 , wherein the cantilever has a width of about one micron to about 100 microns, and a length of about 100 microns to about 400 microns.
19 . The method according to claim 1 , wherein the cantilever has a width of about five microns to about 25 microns.
20 . The method according to claim 1 , wherein the cantilever is a straight beam shaped cantilever and the cantilever is pulled rather than pushed.
21 . The method according to claim 1 , wherein the method is used for thin film transistor repair.
22 . The method according to claim 1 , wherein the cantilever is one of a plurality of cantilevers which deposit ink in parallel.
23 . The method according to claim 1 , wherein the ink is a polyol ink.
24 . The method according to claim 1 , wherein the ink comprises metal salts together with one or more alcohols or polyols.
25 . The method according to claim 1 , wherein the ink forms features on the substrate surface having a lateral dimension of about one micron to about 15 microns.
26 . The method according to claim 1 , wherein the ink forms features on the substrate surface which have a lateral dimension of about one micron to about 10 microns.
27 . The method according to claim 1 , wherein the ink forms features on the substrate surface which have a lateral dimension of about one micron to about 15 microns.
28 - 38 . (canceled)
39 . A method for direct writing of conductive metal or metal precursor comprising
providing a tipless cantilever having a cantilever end; providing an ink disposed at the cantilever end, wherein the ink comprises one or more metals, one or more metallic nanoparticles, or one or more metal salts; providing a substrate surface; contacting the cantilever end and the substrate surface so that ink is delivered from the cantilever end to the substrate surface.
40 . The method according to claim 39 , wherein the cantilever is pulled rather than pushed.
41 . The method according to claim 39 , wherein the tipless cantilever is part of an array of cantilevers.
42 . The method according to claim 39 , wherein the ink comprises metallic nanoparticles.
43 . The method according to claim 39 , wherein the ink after delivery to the substrate surface is cured.
44 . The method according to claim 39 , wherein the ink after deliver to the substrate surface is cured at a temperature of about 300° C. or less.
45 . A method comprising depositing metallic traces from a tipless cantilever loaded with nanoparticle ink across an insulating gap between conductive materials.
46 - 50 . (canceled)Join the waitlist — get patent alerts
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