Predicting the failure of a component
Abstract
The invention provides a method and apparatus for predicting the failure of a component using a probabilistic model of a material's microstructural-based response to fatigue. The method predicts the component failure by a computer simulation of multiple incarnations of real material behavior, or virtual prototyping. The virtual prototyping simulates the effects of characteristics that include grain size, grain orientation, micro-applied stress and micro-yield strength that are difficult to simulate with real specimens. The invention provides an apparatus for predicting the response of a component to fatigue using the method.
Claims
exact text as granted — not AI-modified1 . A method for predicting the failure of a component, the method comprising:
obtaining a Finite Element Model (FEM) of a component; analyzing said FEM to obtain stresses at nodes of said FEM; identifying a subset of said nodes as significant nodes based on said stresses; determining a Representative Volume Element (RVE) for at least one of said significant nodes; developing an RVE microstructure-based failure model for at least one said RVE; simulating a component life using at least one RVE microstructure-based failure model, said simulating producing a result related to said component life; performing said simulating a plurality of times to produce results related to component life; preparing statistics using said results; and comparing said statistics to a probability of failure (POF) criteria to determine whether said performing predicted failure for said component.
2 . The method of claim 1 , wherein said failure is due to fatigue.
3 . The method of claim 1 , said simulating further comprising:
determining an RVE life for each said RVE, said determining an RVE life comprising: evaluating a statistically determined number of nucleation sites within said RVE utilizing probabilistic methods.
4 . The method of claim 1 , wherein said RVE microstructure-based failure model comprises random variables and wherein probabilistic methods are used to provide values for said random variables.
5 . An apparatus for predicting the failure of a component comprising:
a central processing unit (CPU); an output device for displaying simulated fatigue results; an input device for receiving input; and a memory comprising:
instructions for receiving input comprising a component's material characteristics, a Finite Element Model of said component; and at least one Representative Volume Element (RVE) microstructure-based failure model;
instructions for predicting failure of said component comprising:
analyzing said FEM to obtain stresses at nodes of said FEM;
identifying a subset of said nodes as significant nodes based on said stresses;
determining an RVE for at lest one of said significant nodes;
simulating a component using at least one RVE microstructure-based failure model, said simulating producing a result related to component life;
performing said simulating a plurality of times to produce results related to component life;
preparing statistics using said results; and
comparing said statistics to a probability of failure (POF) criteria to determine whether said performing predicted failure for said component; and instructions for displaying a result from said predicting.
6 . The apparatus of claim 5 , wherein said failure is due to fatigue.
7 . The apparatus of claim 5 , wherein said simulating further comprises:
establishing an RVE life for each said RVE; and using each said RVE life to produce a result related to said component life.
8 . The apparatus of claim 5 , wherein each said RVE microstructure-based failure model comprises at least one random variable and wherein probabilistic methods are used to provide values for said at least one random variable.Join the waitlist — get patent alerts
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