US2011263121A1PendingUtilityA1
Manufacturing method for semiconductor device containing stacked semiconductor chips
Est. expirySep 30, 2023(expired)· nominal 20-yr term from priority
H10W 72/5522H10W 74/00H10W 72/884H10W 90/754H10W 72/5449H10W 72/5445H10W 72/926H10W 72/932H10W 90/00H10P 72/7424H10W 74/117H10W 70/60H10P 72/74H05K 2201/0989H05K 2203/095H05K 3/381H05K 3/244Y10S438/906H05K 3/3452H05K 2203/049H05K 3/305
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Claims
Abstract
An adhesive film is formed on an electrode film, and a coating film is formed thereon. Nickel, chrome, molybdenum, tungsten, aluminum or an alloy of them is used as a constituent material of the adhesive film. Gold, silver, platinum or an alloy of them is used as a constituent material of the coating film.
Claims
exact text as granted — not AI-modified1 - 11 . (canceled)
12 . A manufacturing method of a semiconductor device comprising:
providing a base material including a conductor circuit; forming a dielectric film and a pad electrode, the dielectric film covering at least a part of the base material, the pad electrode being connected with the conductor circuit and being located on a surface of the base material or a surface of the dielectric film; and performing plasma treatment on exposed surfaces of the dielectric film and the pad electrode, wherein the pad electrode comprises an electrode film on the dielectric film and a plasma-resistant protective film covering the electrode film.
13 . The manufacturing method of claim 12 , wherein forming the pad electrode includes forming an adhesive film covering the electrode film and forming a plasma-resistant protective film covering the adhesive film.
14 . The manufacturing method of claim 12 , wherein performing plasma treatment forms a cluster of micro projections on the exposed surfaces of the dielectric film.
15 . The manufacturing method of claim 12 , wherein performing plasma treatment forms a cluster of micro projections on the exposed surfaces of the pad electrode.
16 . The manufacturing method of claim 12 , wherein forming the dielectric film and the pad electrode comprises:
forming the dielectric film on a surface of the pad electrode and the base material; and forming an opening in the dielectric film at a location of the pad electrode.Join the waitlist — get patent alerts
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