Image comparison

Abstract

Method and systems for comparing two images with an image processing system is disclosed. A target image and a selected image are aligned. The selected image is divided into a plurality of image regions, and properties of predetermined regions are combined. A primary image region within the selected image is selected, and a target image region within the target image is selected and properties of the two regions are compared.

1 . A non-transitory storage medium with computer-readable instructions for circuit board inspection, the computer-readable instructions comprising code for:
 aligning a target image and a selected image, wherein
 each of the target and selected image has at least one property; and 
 each of the target and selected image are of at least a portion of a circuit board; 
   dividing the selected image into a plurality of image regions, each of the image regions having at least one property;   combining properties in predetermined ones of the plurality of image regions;   selecting a primary image region within the selected image;   selecting a target image region; and   comparing one or more properties in the primary image region within the selected image to a corresponding one or more properties in the target image region.   
     
     
         2 . The non-transitory storage medium with computer-readable instructions for circuit board inspection of  claim 1 , further comprising code for assigning a score indicating a difference between the one or more properties in the primary image region within the selected image and the corresponding one or more properties in the target image region. 
     
     
         3 . The non-transitory storage medium with computer-readable instructions for circuit board inspection of  claim 2 , further comprising code for determining a match based, at least in part, on the score. 
     
     
         4 . The non-transitory storage medium with computer-readable instructions for circuit board inspection of  claim 3 , further comprising code for determining a satisfactory solder joint or component placement exists on the circuit board, based, at least in part, on the match. 
     
     
         5 . The non-transitory storage medium with computer-readable instructions for circuit board inspection of  claim 3 , further comprising code for determining an unsatisfactory solder joint or component placement exists on the circuit board, based, at least in part, on the match. 
     
     
         6 . The non-transitory storage medium with computer-readable instructions for circuit board inspection of  claim 1 , further comprising code for retrieving the target image or the selected image from a database. 
     
     
         7 . A process for comparing two images comprising:
 (a) aligning a target image and a selected image, each of the target and selected images having at least one property;   (b) dividing the selected image into a plurality of image regions, each of the image regions having at least one property;   (c) combining properties in predetermined ones of the plurality of image regions;   (d) selecting a primary image region within the selected image;   (e) selecting a target image region; and   (f) comparing one or more properties in the primary image region within the selected image to a corresponding one or more properties in the target image region.   
     
     
         8 . The process for comparing two images of  claim 7 , further comprising:
 (g) assigning a score indicating a difference between the one or more properties in the primary image region within the selected image and the corresponding one or more properties in the target image region;   (h) selecting a next region in the target image;   (i) comparing one or more properties of the primary image region within the selected image to a corresponding one or more properties in the next target image region; and   (j) assigning a score indicating a difference between the one or more properties in the primary image region within the selected image and the corresponding one or more properties in the next target image region.   
     
     
         9 . The process for comparing two images of  claim 8 , further comprising repeating (h)-(j) for each of a predetermined number of regions in the target image. 
     
     
         10 . The process of  claim 9 , further comprising finding a best match between the primary image region and one of the predetermined number of regions in the target image, wherein the best match is determined by the primary image region and the one of the predetermined number of regions in the target image with a corresponding score indicating a smallest difference. 
     
     
         11 . The process for comparing two images of  claim 10 , further comprising:
 selecting a next primary image region in the selected image; and   repeating items (h)-(j) for each desired primary image region.   
     
     
         12 . The process for comparing two images of  claim 8 , wherein either or both of the target image and the selected image are of a circuit board. 
     
     
         13 . A system for comparing two images, the system comprising:
 an input system;   an image database; and   an image processing system coupled with the input system and the image database, the image processing system configured to:
 (a) align a target image and a selected image,
 each of the target and selected images has at least one property; 
 the target image is retrieved from the image database; and 
 the selected image is received from the input system; 
 
 (b) divide the selected image into a plurality of image regions, each of the image regions having at least one property; 
 (c) combine properties in predetermined ones of the plurality of image regions; 
 (d) select a primary image region within the selected image; 
 (e) select a target image region; and 
 (f) compare one or more properties of the primary image region within the selected image to a corresponding one or more properties in the target image region. 
   
     
     
         14 . The system for comparing two images of  claim 13 , wherein the input system is configured to receive one or more images of a circuit board. 
     
     
         15 . The system for comparing two images of  claim 13 , further comprising at least one plug-in module configured to provide application information used by the image processing system for at least on application. 
     
     
         16 . The system for comparing two images of  claim 15 , wherein the at least one plug-in module provides application information used by the image processing system to process images having at least one item from the group of items consisting of:
 a printed circuit board,   a face,   a scene,   a fabric, and   a trademark.   
     
     
         17 . The system for comparing two images of  claim 13 , wherein the image processing system further is configured to:
 (g) assign a score indicating a difference between the one or more properties in the primary image region within the selected image and the corresponding one or more properties in the target image region;   (h) select a next region in the target image;   (i) compare one or more properties in the primary image region within the selected image to a corresponding one or more properties in the next target image region; and   (j) assign a score indicating a difference between the one or more properties in the primary image region within the selected image and the corresponding one or more properties in the next target image region.   
     
     
         18 . The system for comparing two images of  claim 17 , the image processing system further is configured to repeat (h)-(j) for each of a predetermined number of regions in the target image. 
     
     
         19 . The system for comparing two images of  claim 18 , the image processing system further is configured to find a best match between the primary image region and one of the predetermined number of regions in the target image, wherein the best match is determined by the primary image region and the one of the predetermined number of regions in the target image with a corresponding score indicating a smallest difference. 
     
     
         20 . The system for comparing two images of  claim 19 , the image processing system further is configured to:
 select a next primary image region in the selected image; and   repeat items (h)-(j) for each desired primary image region.