US2011204029A1PendingUtilityA1

Processing system and method for chemically treating a substrate

Assignee: TOKYO ELECTRON LTDPriority: Mar 17, 2003Filed: Apr 25, 2011Published: Aug 25, 2011
Est. expiryMar 17, 2023(expired)· nominal 20-yr term from priority
H10P 72/0604H10P 72/0602H10P 72/0468H10P 72/0441H10P 72/0434H10P 72/0432H10P 72/0421H10P 72/3306C25D 11/02C25D 11/026C23C 16/4405
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Claims

Abstract

A processing system and method for chemically treating a substrate, wherein the processing system comprises a temperature controlled chemical treatment chamber, and an independently temperature controlled substrate holder for supporting a substrate for chemical treatment. The substrate is exposed to a gaseous chemistry, without plasma, under controlled conditions including wall temperature, surface temperature and gas pressure. The chemical treatment of the substrate chemically alters exposed surfaces on the substrate.

Claims

exact text as granted — not AI-modified
1 . A method of etching a substrate, comprising:
 disposing a substrate on a temperature controlled substrate holder in a temperature controlled chemical treatment chamber; and   performing a chemical treatment process in said chemical treatment chamber on said substrate to chemically alter a surface layer of said substrate to produce a non-volatile reaction product by using a non-plasma environment, said chemical treatment process comprising:   controlling a temperature of said chemical treatment chamber to within a range of about 10° C. to about 200° C.,   introducing one or more process gases to said chemical treatment chamber via a gas distribution system, at least one of said one or more process gases chemically reacting with said surface layer to produce said non-volatile reaction product, wherein said gas distribution system comprises a temperature controlled portion exposed to said one or more process gases in said chemical treatment chamber, and   controlling a temperature of said temperature controlled portion to within a range of about 10° C. to about 200° C.   
     
     
         2 . The method of  claim 1 , further comprising:
 controlling a temperature of said substrate to within a range of about 10° C. to about 50° C.   
     
     
         3 . The method of  claim 1 , wherein said one or more process gases comprises HF, or NH 3 , or both HF and NH 3    
     
     
         4 . The method of  claim 1 , further comprising:
 transferring said substrate from said chemical treatment chamber to a thermal treatment chamber; and   performing a thermal treatment process in said thermal treatment chamber to evaporate and remove said chemically altered surface layer by producing a volatile reaction product therefrom, said thermal treatment process comprising:   elevating a temperature of said substrate in excess of about 100° C.

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