US2011105345A1PendingUtilityA1
Methods for the Analysis of High Resolution Melt Curve Data
Est. expiryJul 31, 2029(~3 yrs left)· nominal 20-yr term from priority
G16B 40/10G16B 40/20G16B 30/00G16B 40/30G01N 2021/6439C12Q 1/6827C12Q 1/6816G01N 21/6428G16B 40/00G01N 25/04
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Claims
Abstract
The present application provides for various embodiments of methods for the analysis of high resolution melt (HRM) curve data; where statistical assay variations in melt curve data may result from system noise in an analysis system. Such system noise may arise from various sources, such as the thermal non-uniformity of a thermocycler block in a thermal cycler apparatus, a detection system, etc. Additionally, various methods for the analysis of HRM curve data may provide an identification of a sample without the need for a user inputted information.
Claims
exact text as granted — not AI-modified1 . A method for analyzing melt curve data, the method comprising:
providing melt curve data for at least one test sample deposited in a plurality of support regions of a sample support device in thermal cycler system, wherein the melt curve data is an experimental set of melt curve data; and selecting a weighting function, wherein the weighing function selected is used for the construction of a dendrogram of the corrected experimental set of melt curve data; constructing a dendrogram of the corrected experimental set of melt curve data, wherein the dendrogram creates a set of at least one cluster from the corrected experimental set of melt curve data; and determining a cut level of the dendrogram, wherein the cut level determines a final number of clusters from the set of at least one cluster.
2 . The method of claim 1 , wherein the at least one test sample is a plurality of test samples.
3 . The method of claim 2 , wherein the weighting function utilizes all data points in each of a corrected experimental set of melt curve data for each test sample.
4 . The method of claim 2 , further comprising:
providing melt curve data for a calibration sample deposited in a plurality of support regions of a sample support device in a thermal cycler system, wherein the melt curve data is a calibration set of melt curve data; and correcting the experimental set of melt curve data using the calibration set of melt curve data.
5 . The method of claim 4 , wherein the correction is done on a derivative form of the melt curve data.
6 . The method of claim 4 , wherein the correction of the experimental set of melt curve data using the calibration set of melt curve data is a correction for assay system noise.
7 . The method of claim 6 , wherein the source of assay system noise is thermal non-uniformity.
8 . The method of claim 6 , wherein the source of assay system noise is excitation source non-uniformity.
9 . The method of claim 6 , wherein the source of assay system noise is detection noise.
10 . The method of claim 2 , further comprising the step of scaling the corrected experimental set of melt curve data over an estimated temperature range.
11 . The method of claim 10 , further comprising the step of fitting the scaled corrected experimental set of melt curve data to an estimated asymptote for a low temperature region of a melting region of the melt curve data.Join the waitlist — get patent alerts
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