US2011008545A1PendingUtilityA1

Film forming method, film forming apparatus, pattern forming method, and manufacturing method of semiconductor apparatus

Assignee: TOSHIBA KKPriority: Jan 30, 2002Filed: Sep 20, 2010Published: Jan 13, 2011
Est. expiryJan 30, 2022(expired)· nominal 20-yr term from priority
H10P 14/69215H10P 14/6922H10P 14/6342H10P 14/662H10P 14/46H10P 72/0448B05B 1/005B05C 11/10
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Claims

Abstract

There is disclosed a film forming method comprising continuously discharging a solution adjusted so as to spread over a substrate by a given amount to the substrate through a discharge port disposed in a nozzle, moving the nozzle and substrate with respect to each other, and holding the supplied solution onto the substrate to form a liquid film, wherein a distance h between the discharge port of the nozzle and the substrate is set to be not less than 2 mm and to be in a range less than 5×10 −5 qγ (mm) given with respect to a surface tension γ (N/m) of the solution, discharge speed q (m/sec) of the solution continuously discharged through the discharge port, and a constant of 5×10 −5 (m·sec/N).

Claims

exact text as granted — not AI-modified
1 . A film forming method of discharging a solution from a discharge port of a nozzle onto the substrate, and then providing relative movement between the nozzle and the substrate while keeping the liquid discharging on the substrate, so as to form a liquid film on the substrate,
 wherein a distance h between the discharge port of the nozzle and the substrate is set to be not less than 2 mm and to be less than Aqγ (mm),   wherein q (m/sec) denotes a discharge speed of the solution continuously discharged through the discharge port,   γ (N/m) denotes a surface tension of the solution, and   A (m·sec/N) is 5×10 −5 .   
     
     
         2 - 87 . (canceled)

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