Analysis method, analysis device and production method therefor

Abstract

The present invention relates to a technique for analyzing the concentration of a specific component in a sample liquid, such as a method for analyzing a sample. The analyzing method includes a first detection step for irradiating light from a light source ( 50 ) onto a reaction system to detect a response from the reaction system ( 56 ) as a first detection result. The reaction system contains a sample liquid and a reagent. The method also includes a second detection step for irradiating light onto a reference board ( 54 ) to detect a response from the reference board as a second detection result. The response from the reference board under light irradiation is dependent on wavelength. The method further includes a calculation step for calculating the concentration of the specific component in the sample liquid based on the first and second detection results.

1 - 13 . (canceled) 
     
     
         14 . A method of producing an analyzing device which comprises a light irradiator for irradiating light onto a reaction system which includes a sample liquid and a reagent, a detector for detecting a response from the reaction system under light irradiation, a calculator for calculating a concentration of a specific component in the sample liquid based on the detection at the detector, and a storage for storing information necessary for calculation as to the specific component, the method comprising:
 a detection step for irradiating light from the light irradiator onto a reference board to detect a response from the reference board under light irradiation for determining a light emitting state of the light irradiator, the response from the reference board being dependent on wavelength; and   a storage step for storing the light emitting state in the storage as information for use in calculation at the calculator.   
     
     
         15 . The analyzing device production method according to  claim 14 , further comprising
 a calibration curve selecting step for selecting a calibration curve corresponding to the light emitting state, from a plurality of calibration curves representing relationship between the detection result at the detector and the concentration of the specific component, based on the detection in the detection step,   wherein the storage step includes storage of the calibration curve selected in the calibration curve selecting step for use in calculation at the calculator.   
     
     
         16 . The analyzing device production method according to  claim 14 ,
 wherein the light emitting state is detected as a peak wavelength of emitted light in the detection step,   the peak wavelength being stored by the storage in the storage step.   
     
     
         17 . The analyzing device production method according to  claim 14 , wherein the reference board used in the detection step is incorporated in the analyzing device beforehand. 
     
     
         18 . The analyzing device production method according to  claim 14 , wherein the reference board used in the detection step is prepared separately from the analyzing device.