US2010314649A1PendingUtilityA1
Thin-film led with p and n contacts electricall isolated from the substrate
Est. expiryJun 10, 2029(~2.9 yrs left)· nominal 20-yr term from priority
Inventors:Chao-Kun Lin
H10W 90/00H10W 72/884H10H 20/882H10H 20/858H10H 20/841H10H 20/0365H10H 20/0364H10H 20/857H10H 20/835H10H 20/018H10H 20/01H10H 20/856H10H 20/83H10H 20/815H10H 20/831H10H 20/832H10H 20/80
51
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
A thin-film LED includes an insulating substrate, an electrode on the insulating substrate, and an epitaxial structure on the electrode.
Claims
exact text as granted — not AI-modified1 - 32 . (canceled)
33 . A method of manufacturing a thin-film light emitting diode, comprising:
forming an epitaxial structure on a growth substrate, the epitaxial structure comprising a first epitaxial layer, a second epitaxial layer, and an active region between the first epitaxial layer and the second epitaxial layer; forming an electrode layer on the second epitaxial layer of the epitaxial structure; attaching a host substrate with a conductive adhesive layer to the electrode layer; removing the growth substrate; and removing part of the epitaxial structure to form a mesa with the epitaxial structure and to expose at least one of the second epitaxial layer or the electrode layer.
34 . The method of claim 33 , wherein the host substrate is an insulating substrate.
35 . The method of claim 33 , wherein the host substrate is a conductive substrate and an insulating dielectric film layer is between the host substrate and the conductive adhesive layer.
36 . The method of claim 33 , further comprising roughening a surface of the first epitaxial layer to form micro-structures on the surface, the micro-structures being between about 100 nm and 500 nm in size.
37 . The method of claim 36 , further comprising:
forming a patterned second electrode on the surface of the first epitaxial layer; and forming a metal contact on said at least one of the second epitaxial layer or the electrode layer.
38 . The method of claim 37 , wherein the epitaxial structure is etched to expose the electrode layer and the metal contact is formed on the electrode layer.
39 . The method of claim 33 , further comprising forming a metal layer on a bottom surface of the host substrate.
40 . The method of claim 33 , further comprising:
forming an insulating dielectric film layer on a bottom surface of the host substrate; and forming a metal layer on the insulating dielectric film layer.Join the waitlist — get patent alerts
Track US2010314649A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.