Integrated Circuit Arrangement

Abstract

An integrated circuit arrangement has a signal input 20 and a signal output 60 , a signal processing unit 100 which is connected to the signal input 20 and to the signal output 60 , a noise source 50 for generating a noise signal, and a noise line 55 which connects the noise source 50 to the signal input 20.

1 . An integrated circuit arrangement having:
 a signal input and a signal output;   a signal processing unit which is connected to the signal input and to the signal output;   a noise source for generating a noise signal and having a control input; and   a noise line which connects the noise source to the signal input,   wherein the components of the integrated circuit arrangement are integrated on a single integrated circuit chip.   
     
     
         2 . The integrated circuit arrangement according to  claim 1 , comprising a first interruption unit which, in a first state, allows the signal flow of the noise signal to the signal input and, in a second state, interrupts the signal flow of the noise signal to the signal input. 
     
     
         3 . The integrated circuit arrangement according to  claim 2 , wherein the interruption unit has a switching element, a fuse and/or an antifuse. 
     
     
         4 . The integrated circuit arrangement according to  claim 2 , wherein the transition between the first and second states of the interruption unit is able to be implemented by means of an electrical current. 
     
     
         5 . The integrated circuit arrangement according to  claim 2 , wherein the transition between the first and second states of the interruption unit is able to be implemented by means of irradiation, in particular with a laser beam. 
     
     
         6 . The integrated circuit arrangement according to  claim 2 , wherein the signal input has a connection pad on the single integrated circuit chip and an input signal line, and the interruption unit is integrated on the single integrated circuit chip and is arranged in the immediate vicinity of the connection pad. 
     
     
         7 . The integrated circuit arrangement according to  claim 1 , wherein the noise source has a resistor and/or an avalanche diode. 
     
     
         8 . The integrated circuit arrangement according to  claim 2 , wherein the noise source has a heating unit. 
     
     
         9 . The integrated circuit arrangement according to  claim 2 , wherein the noise source has an amplifier. 
     
     
         10 . The integrated circuit arrangement according to  claim 2 , wherein the signal processing unit has a mixer, a demodulator and/or a filter. 
     
     
         11 . The integrated circuit arrangement according to  claim 2 , wherein the circuit arrangement has a signal source which is connected to the signal processing unit by means of a signal line. 
     
     
         12 . The integrated circuit arrangement according to  claim 11 , wherein the signal source is an RF oscillator, in particular a voltage-controlled RF oscillator. 
     
     
         13 . The integrated circuit arrangement according to  claim 11 , comprising a second interruption unit which, in a first state, allows the signal flow to the signal processing unit and, in a second state, interrupts the signal flow to the signal processing unit. 
     
     
         14 . The integrated circuit arrangement according to  claim 2 , wherein the circuit arrangement has at least two signal inputs for receiving a symmetrical input signal, said signal inputs being connected to a respective noise source by means of a respective noise line. 
     
     
         15 . A method for testing an integrated circuit arrangement having a signal processing unit, which is connected to a signal input and to a signal output, and a noise source, wherein the components of the integrated circuit arrangement are integrated on a single integrated circuit chip, said method having the following steps:
 a) providing the integrated circuit arrangement and contact-connecting the integrated circuit arrangement to a measuring device at the signal output;   b) measuring the output signal from the signal processing unit at the signal output with respect to a noise signal having a first noise level; and   c) measuring the output signal from the signal processing unit at the signal output with respect to a noise signal having a second noise level that is different than the first noise level.   
     
     
         16 . A method for testing an integrated circuit arrangement having a signal processing unit, which is connected to a signal input and to a signal output, a noise source and a first interruption unit, wherein the components of the integrated circuit arrangement are integrated on a single integrated circuit chip, said method having the following steps:
 a) providing the integrated circuit arrangement with the interruption unit in a first state in which the signal flow of the noise signal from the noise source to the signal processing unit is allowed, and contact-connected the integrated circuit arrangement to a measuring device at the signal output;   b) measuring the output signal from the signal processing unit at the signal output with respect to the noise signal; and   c) after the measurement has been concluded, changing the first interruption unit to a second state in which the signal flow of the noise signal from the noise source to the signal processing unit is interrupted;   wherein the measurement is carried out with at least two different noise levels.   
     
     
         17 . The method according to  claim 16 , wherein the first interruption unit is changed to a second state in an irreversible manner. 
     
     
         18 . The method according to  claim 16 , wherein the first interruption unit is changed to the second state by means of irradiation, in particular with a laser. 
     
     
         19 . The method according to  claim 16 , wherein the measurement is carried out while a signal is passed from a signal source of the circuit arrangement to the signal processing unit. 
     
     
         20 . The method according to  claim 19 , wherein a second interruption unit is changed, after the measurement has been concluded, to a second state in which the signal flow from the signal source to the signal processing unit is interrupted. 
     
     
         21 . The method according to  claim 20 , wherein the second interruption unit is changed to a second state in an irreversible manner. 
     
     
         22 . The method according to  claim 15 , wherein the characteristics of the noise source is determined by means of process control measurements during the production process used. 
     
     
         23 . An integrated circuit arrangement having:
 a signal input and a signal output;   a signal processing unit which is connected to the signal input and to the signal output;   a noise source for generating a noise signal;   a noise line which connects the noise source to the signal input; and   a first interruption unit which, in a first state, allows the signal flow of the noise signal to the signal input and, in a second state, interrupts the signal flow of the noise signal to the signal input,   
       wherein the components of the integrated circuit arrangement are integrated on a single integrated circuit chip.