Modular Probe System

Abstract

A modular probe system that includes components that are selected to test different devices-under-test (DUTs) in a number of different scientific fields. The system includes quick-release connectors that may be used to releasably secure components of the modular probe system to one another or to a mounting interface. These connectors permit quick and easy attachment and detachment of various components in a manner that permits a user to readily configure the probe system for each DUT.

1 . A modular test system for testing a device-under-test (DUT), said system comprising:
 a mounting interface;   a plurality of components removably positionable, directly or indirectly, on said mounting interface, said plurality of components including at least one probe, wherein said plurality of components together are used in connection with testing a DUT; and   a plurality of quick-release connectors for releasably securing said plurality of components together or to said mounting interface by hand or with only hand tools in under 60 minutes.   
     
     
         2 . A modular test system according to  claim 1 , wherein said plurality of components include a chuck for supporting a DUT during testing, a stage for moving said chuck and the DUT, a manipulator for supporting said at least one probe in selected relationship to the DUT, and a vision system for generating images of portions of the DUT. 
     
     
         3 . A modular test system according to  claim 1 , wherein said plurality of components include a chuck for supporting a DUT during testing, a material handler for moving the DUT onto and off of said chuck, and a manipulator for supporting said at least one probe in selected relationship to the DUT, further wherein at least one of said chuck, material handler and manipulator include a translation device for moving said at least one said chuck, material handler and manipulator, said translation device having manual, semiautomatic or fully automatic operation. 
     
     
         4 . A modular test system according to  claim 1 , wherein said plurality of components includes a vision system releasably secured to said mounting interface, said vision system providing an image of the DUT. 
     
     
         5 . A modular test system according to  claim 1 , wherein said translation device moves said DUT in a manual or automatic mode. 
     
     
         6 . A modular test system according to  claim 1 , wherein said plurality of quick-release connectors has a release torque that does not exceed about 50 ft*lbs. 
     
     
         7 . A modular test system according to  claim 1 , wherein said plurality of quick-release connectors has a release torque that does not exceed about 20 ft*lbs. 
     
     
         8 . A modular test system according to  claim 1 , wherein said mounting interface includes a plurality of apertures shaped and configured to engage with said plurality of quick-release connectors. 
     
     
         9 . A modular test system according to  claim 1 , wherein said plurality of components includes a first chuck for supporting a first DUT used in a first technical field and a second chuck for supporting a second DUT used in a second technical field that is different than said first technical field. 
     
     
         10 . A method of testing a device-under-test (DUT), said method comprising:
 a) providing a testing system having a mounting interface;   b) releasably securing a first plurality of components used in testing a DUT to said mounting interface; and   c) removing at least some of said first plurality of components from said mounting interface and releasably securing a second plurality of components used in testing a DUT to said mounting interface, wherein said first plurality of components are removed and said second plurality of components are releasably secured by hand or using only hand tools in less than about 60 minutes.   
     
     
         11 . A method according to  claim 10 , wherein said removing step involves removing said first plurality of components and releasably securing said second plurality by hand or using only hand tools in less than about 30 minutes. 
     
     
         12 . A method according to  claim 10 , further comprising:
 performing a first test on a first DUT following said releasably securing step b) and before said removing step c); and   performing a second test on a second DUT following said removing step c), wherein said second DUT is used in a different technical field than said first DUT.   
     
     
         13 . A method according to  claim 10 , further comprising:
 performing a first test on a first DUT following said releasably securing step b) and before said removing step c); and   performing a second test on a second DUT following said removing step c), wherein said second DUT has a different size than said first DUT.   
     
     
         14 . A method according to  claim 10 , wherein said removing step c) involves removing at least some of said first plurality of components with a torque that does not exceed about 50 ft*lbs and releasably securing said second plurality of components with a torque that does not exceed about 50 ft*lbs. 
     
     
         15 . A method according to  claim 10 , wherein said removing step c) involves removing at least some of said first plurality of components with a torque that does not exceed about 20 ft*lbs and releasably securing said second plurality of components with a torque that does not exceed about 20 ft*lbs.