Solid-state imaging device and electronic apparatus

Abstract

A solid-state imaging device includes: a light-receiving element; and a multilayer film which is disposed on a side of a light-receiving surface of the light-receiving element and is formed by laminating a plurality of layers made of materials having different refractive indices, in which a defect layer is included in at least one of the laminated layers, wherein in the defect layer, a plurality of kinds of materials having different refractive indices coexist in a surface parallel to the light-receiving surface.

1 . A solid-state imaging device comprising:
 a light-receiving element; and   a multilayer film which is disposed on a side of a light-receiving surface of the light-receiving element and is formed by laminating a plurality of layers made of materials having different refractive indices, in which a defect layer is included in at least one of the laminated layers,   wherein in the defect layer, a plurality of kinds of materials having different refractive indices coexist in a surface parallel to the light-receiving surface.   
     
     
         2 . The solid-state imaging device according to  claim 1 , wherein the plurality of materials that constitute the multilayer film are inorganic materials. 
     
     
         3 . The solid-state imaging device according to  claim 1 , wherein in the defect layer, the plurality of kinds of materials having different refractive indices coexist in the surface symmetrically in two orthogonal directions. 
     
     
         4 . The solid-state imaging device according to  claim 1 , wherein in the defect layer, the ratio of areas of the materials coexisting in the surface is set based on the wavelength of light reaching the light-receiving element. 
     
     
         5 . The solid-state imaging device according to  claim 4 , wherein
 a plurality of the light-receiving elements are arranged on the surface; and   in the defect layer, the ratio of areas of the materials is different at respective positions which correspond to the respective light-receiving elements.   
     
     
         6 . The solid-state imaging device according to  claim 4 , wherein in the defect layer, the ratio of areas of the materials is different at different positions which are respectively located closer to a central portion and a periphery of an effective imaging region that is formed by each of the light-receiving elements. 
     
     
         7 . The solid-state imaging device according to  claim 4 , wherein in the defect layer, the ratio of areas of the materials is different at different positions which are respectively located closer to a central portion and a periphery of one pixel region that is formed by each of the light-receiving elements. 
     
     
         8 . The solid-state imaging device according to  claim 1 , wherein the plurality of materials that constitute the multilayer film and the plurality of kinds of materials having different refractive indices that constitute the defect layer are composed of two materials which have a refractive index difference of 1 or more. 
     
     
         9 . The solid-state imaging device according to  claim 1 , wherein the multilayer film has a laminated structure in which two layers made of the plurality of materials are laminated above and below the defect layer. 
     
     
         10 . An electronic apparatus having a solid-state imaging device mounted thereon, the solid-state imaging device comprising:
 a light-receiving element; and   a multilayer film which is disposed on a side of a light-receiving surface of the light-receiving element and is formed by laminating a plurality of layers made of materials having different refractive indices, in which a defect layer is included in at least one of the laminated layers,   wherein in the defect layer, a plurality of kinds of materials having different refractive indices coexist in a surface parallel to the light-receiving surface.