Stitch quality monitoring system

Abstract

A stitcher is provided that includes a needle configured to place stitches in a fabric that is moved therethrough. The stitcher includes a sensor positioned below the fabric to monitor stitches placed in the fabric. A microcontroller is provided configured to receive data from the sensor and, based on such data, to compare one or more attributes of the monitored stitches with one or more predetermined parameters relating at least one attribute of the fabric. The predetermined parameter may be either hardcoded inn the microcontroller or input by a user of the stitcher prior to beginning operation of the machine. When the attributes of the monitored stitches fall outside of the predetermined parameters, the microcontroller initiates notification of the user.

1 . A monitoring system for a stitcher, said monitoring system comprising:
 a sensor positioned adjacent to a workspace of the stitcher and below a fabric positioned within said workspace, said sensor configured to detect stitches placed in the fabric and create images of each detected stitch as said stitcher operates;   at least one predetermined parameter relating to at least one attribute of said detected stitches;   a microcontroller in communication with said sensor;   a memory in communication with said microcontroller, said at least one predetermined parameter being stored in said memory;   said microcontroller being configured to receive said images from said sensor, isolate said at least one attribute of each said detected stitch in said images, and to compare said at least one attribute to said at least one predetermined parameter during operation of said stitcher;   means for notification in communication with said microcontroller to notify a user of said stitcher if said at least one attribute of said detected stitch falls outside of said at least one predetermined parameter.   
     
     
         2 . The monitoring system as set forth in  claim 1 , wherein said sensor is a CMOS sensor. 
     
     
         3 . The monitoring system as set forth in  claim 1 , wherein said sensor is digitally interfaced with said microcontroller. 
     
     
         4 . The monitoring system as set forth in  claim 1 , wherein said sensor is positioned to a side of said workspace and angled toward a needle of said stitcher to detect said stitches. 
     
     
         5 . The monitoring system as set forth in  claim 1 , wherein said sensor is positioned in front of said workspace and angled toward a needle of said stitcher to detect said stitches. 
     
     
         6 . The monitoring system as set forth in  claim 1  further comprising a plurality of sensors configured to detect said stitches. 
     
     
         7 . The monitoring system as set forth in  claim 6 , wherein said microcontroller is configured to analyze images received from each of said plurality of sensors and to compare said images to said at least one predetermined parameter. 
     
     
         8 . The monitoring system as set forth in  claim 1 , wherein said predetermined parameters are hardcoded in said memory and said memory is integral with said microcontroller. 
     
     
         9 . The monitoring system as set forth in  claim 1 , wherein said predetermined parameters are input by a user of said stitcher prior to beginning operation of said stitcher. 
     
     
         10 . The monitoring system as set forth in  claim 1 , wherein said at least one said attribute of said detected stitches is selected from the group consisting of a stitch length, a size of thread used to make said stitches, stitch looping, thread bunching, stitch length, and a distance between stitches. 
     
     
         11 . The monitoring system as set forth in  claim 1 , wherein said means for notification further comprises an audio/visual device. 
     
     
         12 . The monitoring system as set forth in  claim 1 , wherein said microcontroller is configured to automatically stop operation of said stitcher when said at least one attribute of said detected stitch falls outside of said at least one predetermined parameter. 
     
     
         13 . A monitoring system as set forth in  claim 1 , further comprising a monitor configured to display an image of each detected stitch to a user. 
     
     
         14 . A stitcher comprising:
 a needle configured to place stitches in a fabric that is moved through said stitcher;   a first sensor positioned below said fabric to monitor said stitches while said stitcher operates;   a microcontroller in communication with said first sensor and configured to receive data from said first sensor, to compare at least one attribute of said monitored stitches to at least one predetermined parameter relating to said at least one attribute based on said data received from said first sensor, and to determine if said at least one attribute of said monitored stitches satisfies said at least one predetermined parameter, wherein, when said at least one attribute of said monitored stitches falls outside of said at least one predetermined parameter, a user of said stitcher is notified while said stitcher is in operation.   
     
     
         15 . The stitcher as set forth in  claim 14 , wherein said stitcher is one of a long-arm stitcher and a standard sewing machine. 
     
     
         16 . The stitcher as set forth in  claim 14 , wherein said at least one attribute is selected from the group consisting of a stitch length, a size of thread used to make said stitches, stitch looping, thread bunching, stitch length, and a distance between stitches. 
     
     
         17 . The stitcher as set forth in  claim 14 , further comprising at least a second sensor positioned below said fabric and also in communication with said microcontroller, wherein said microcontroller is configure to receive data from said second sensor and to compare said at least one attribute of said monitored stitches to said at least one predetermined parameter based on said data received from said second sensor. 
     
     
         18 . A method of operating a stitcher, said method comprising:
 positioning a sensor below a fabric moved through said stitcher;   monitoring, with said sensor, stitches placed in said fabric by said needle;   communicating data relating to at least one attribute of said monitored stitches from said sensor to a microcontroller in communication with said sensor;   comparing, in said microcontroller, said at least one attribute of said monitored stitches with at least one predetermined parameter relating to said at least one attribute during operation of said stitcher; and   notifying a user of said stitcher is said at least one attribute of said monitored stitches falls outside of said set of predetermined parameters.   
     
     
         19 . The method as set forth in  claim 19 , wherein the step of comparing said at least attribute of said monitored stitches with said at least one predetermined parameter further comprises comparing at least one attribute selected from the group consisting of a stitch length, a size of thread used to make said stitches, stitch looping, thread bunching, stitch length, and a distance between stitches.