US2010148370A1PendingUtilityA1
Through-silicon via and method for forming the same
Est. expirySep 30, 2026(~0.2 yrs left)· nominal 20-yr term from priority
Inventors:Kwon Whan Han
H10W 70/65H10W 20/0245H10W 20/0265H10W 20/023H10D 64/011
44
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Claims
Abstract
A method for forming a through-silicon via includes the steps of defining a groove in each chip of a wafer which has a plurality of semiconductor chips; applying liquid polymer on the wafer to fill the groove; forming an insulation layer on a sidewall of the groove through patterning the polymer; forming a metal layer to fill the groove which is formed with the insulation layer on the sidewall thereof; and back-grinding a backside of the wafer to expose the metal layer filled in the groove.
Claims
exact text as granted — not AI-modified1 . A semiconductor wafer having a through-silicon via, said semiconductor wafer comprising: a groove formed into a wafer; an insulation layer formed on a surface of the groove; and a metal filled in the groove, wherein the insulation layer is comprised of a mechanically compliant polymer.
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