US2010068663A1PendingUtilityA1

Method for Contaminant Removal

Assignee: TEXAS INSTRUMENTS INCPriority: Apr 20, 2006Filed: Nov 18, 2009Published: Mar 18, 2010
Est. expiryApr 20, 2026(expired)· nominal 20-yr term from priority
G03F 7/425G03F 7/322
47
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Claims

Abstract

Method for removing contaminants from a surface during semiconductor fabrication. A preferred embodiment comprises developing a resist layer on a top surface of a semiconductor substrate, curing the developed resist layer, and cleaning the developed resist layer with a developer solution to remove contaminants. The cleaning makes use of the same developer solution used to develop the resist layer, so the cleaning makes use of a process that already exists and requires no additional investment to implement, while the curing stabilizes the developed resist layer so that the cleaning does not damage the developed resist layer.

Claims

exact text as granted — not AI-modified
1 . A method for cleaning contaminants from a semiconductor substrate, the method comprising:
 developing a resist layer on a top surface of the semiconductor substrate;   curing the developed resist layer; and   cleaning the developed resist layer with a developer solution to remove contaminants.   
   
   
       2 . The method of  claim 1 , wherein the developing comprises:
 patterning the resist layer; and   applying the developer solution to remove portions of the patterned resist layer.   
   
   
       3 . The method of  claim 1 , wherein the developer solution used to remove contaminants is also used to develop the resist layer. 
   
   
       4 . The method of  claim 3 , wherein the resist layer comprises an I-line resist or a deep ultraviolet resist, and wherein the developer solution comprises tetramethyl ammonium hydroxide in solution. 
   
   
       5 . The method of  claim 3 , wherein the curing comprises stabilizing the developed resist layer. 
   
   
       6 . The method of  claim 5 , wherein the curing comprises an ultraviolet cure with a heat source. 
   
   
       7 . The method of  claim 6 , wherein the curing comprises an ultraviolet light with wavelength ranging from 270 nm to 330 nm and a cure temperature of about 180 Celsius for about 90 seconds. 
   
   
       8 . The method of  claim 1 , wherein the cleaning comprises rinsing the semiconductor substrate with the developer solution. 
   
   
       9 - 20 . (canceled)

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