Probing Apparatus

Abstract

A probe for probing an electrical device under test is provided. The probe comprises a camera positioned adjacent a probing tip of the probe. Visual information captured by the camera is displayed on a display device. The camera may be mounted in multiple locations as desired by a user and additionally, multiple cameras may be used with the probe to allow for more viewing angles.

1 . A probe for probing an electrical device under test, comprising:
 a selectively positionable door defining a recessed compartment; and   a light source positioned within the recessed compartment;   whereby when the door is in a first position, the compartment is closed, and when the door is in a second position, the compartment is opened.   
   
   
       2 . The probe of  claim 1 , further comprising a reflective portion of an internal surface of the door;
 wherein when the door is in the second position, light from the light source is reflected from the reflective portion of the door.   
   
   
       3 . The probe of  claim 2 , wherein the reflected light source illuminates an area about the tip of the probe. 
   
   
       4 . The probe of  claim 2 , wherein the light source is activated upon the positioning of the door in the second position. 
   
   
       5 . The probe of  claim 1 , wherein the light source is an LED. 
   
   
       6 . The probe of  claim 6 , wherein a color of the LED indicates a state of the probe. 
   
   
       7 . The probe of  claim 7 , wherein at least one LED color indicates electrical contact with a device under test. 
   
   
       8 . A probe for probing an electrical device under test, comprising:
 a selectively positionable door; and   a magnifying element positioned within the door.   
   
   
       9 . The probe of  claim 8 , wherein when the door is in the second position, light from the vicinity of a tip of the probe is magnified for a probe operator. 
   
   
       10 . The probe of  claim 9 , wherein a light source is activated upon the positioning of the door in the second position. 
   
   
       11 . The probe of  claim 10 , wherein the light source comprises an LED positioned adjacent a tip of the probe. 
   
   
       12 . The probe of  claim 10 , wherein the light source is positioned within a recessed compartment defined by the door. 
   
   
       13 . A probe for probing an electrical device under test, comprising:
 a light source positioned adjacent a probing tip of the probe.   
   
   
       14 . The probe of  claim 13 , wherein the light source is an LED. 
   
   
       15 . The probe of  claim 14 , wherein a color of the LED indicates a state of the probe. 
   
   
       16 . The probe of  claim 15 , wherein at least one LED color indicates electrical contact with a device under test. 
   
   
       17 . A probe for probing an electrical device under test, comprising:
 a camera positioned adjacent a probing tip of the probe.   
   
   
       18 . The probe of  claim 17 , wherein visual information captured by the camera is displayed on a display device. 
   
   
       19 . The probe of  claim 18 , wherein a connection between the camera and the display device is provided wirelessly. 
   
   
       20 . The probe of  claim 18 , wherein the wireless connection is a bluetooth connection. 
   
   
       21 . The probe of  claim 18 , wherein a connection between the camera and the display device is provided by a cable. 
   
   
       22 . The probe of  claim 18 , wherein the visual information is displayed in a magnified view. 
   
   
       23 . The probe of  claim 17 , wherein the camera comprises a miniaturized fiber optic camera lens. 
   
   
       24 . A probe for probing an electrical device under test, comprising:
 a first camera positioned adjacent a probing tip of the probe;   a second camera positioned adjacent a probe body of the probe;   wherein visual information captured by the first and second cameras is displayed on a display device.   
   
   
       25 . The probe of  claim 24 , wherein visual information captured by each of the first and second cameras show alternative views of the probe tip. 
   
   
       26 . The probe of  claim 24 , wherein the visual information captured by each of the first and second cameras show different viewing angles of a probe tip connection. 
   
   
       27 . The probe of  claim 24 , wherein at least one of the first and second cameras is removable. 
   
   
       28 . A probe for probing an electrical device under test, comprising:
 a camera mounted to a probe body of the probe, the camera capturing visual information of the probe tip connection between the probe tip and a device under test   
   
   
       29 . The probe of  claim 28 , wherein the camera is mounted adjacent a probe tip of the probe. 
   
   
       30 . The probe of  claim 28 , wherein the camera is mounted to a probe body of the probe. 
   
   
       31 . The probe of  claim 30 , wherein the prober is removably mounted.