US2010014372A1PendingUtilityA1
Semiconductor Device, an Electronic Device and a Method for Operating the Same
Est. expiryApr 12, 2027(~0.7 yrs left)· nominal 20-yr term from priority
Inventors:Stefan Slesazeck
H10D 30/711H10B 12/20G11C 11/406G11C 2211/4065H10B 12/00G11C 2211/4068G11C 11/4074G11C 2211/4016
49
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Claims
Abstract
A semiconductor memory device includes circuitry coupled to a plurality of memory cells with transistors. The circuitry is configured to change a potential of a body of the transistor to a degree depending on a charging state of the body. A gate electrode of the transistor is maintained in a non-addressed state.
Claims
exact text as granted — not AI-modified1 . A semiconductor memory device comprising:
a plurality of memory cells, wherein each of the memory cells comprises a transistor, and each transistor includes a gate electrode and first and second doped portions; wordlines coupled to gate electrodes of the transistors; bitlines coupled to first doped portions of the transistors; source lines coupled to second doped portions of the transistors; and circuitry coupled to the memory cells, wherein the circuitry is configured to perform a self-refresh operation of the memory device while substantially maintaining a voltage applied to the wordlines.
2 . The semiconductor memory device of claim 1 , wherein the circuitry further comprises data sensing circuitry coupled to the plurality of memory cells, the data sensing circuitry being configured to determine data states of the memory cells.
3 . The semiconductor memory device of claim 2 , wherein each transistor comprises an electrically floating body transistor configured to generate a current between the first and second doped portions that is representative of a data state of the respective memory cell, and the current is generated in response to a read control signal transmitted by the data sensing circuitry.
4 . The semiconductor memory device of claim 1 , wherein the circuitry is configured to apply a predetermined potential difference between a selected bitline and a selected source line.
5 . The semiconductor memory device of claim 1 , wherein the transistor of each memory cell is an N-channel type transistor.
6 . The semiconductor memory device of claim 1 , wherein the electrically floating body transistor of each memory cell is a P-channel type transistor.
7 . A semiconductor memory device comprising:
a plurality of memory cells, each of the memory cells comprising a transistor; wordlines coupled to gate electrodes of the transistors; bitlines coupled to first doped portions of the transistors; source lines coupled to second doped portions of the transistors; and circuitry coupled to the memory cells, wherein the circuitry is configured to perform a self-refresh operation of all the memory cells being coupled to at least one source line or to at least one bitline.
8 . The semiconductor memory device of claim 7 , wherein the circuitry is configured to apply a predetermined voltage to at least one of the source lines or to at least one of the bitlines.
9 . A semiconductor memory device comprising:
a plurality of memory cells, each of the memory cells including a transistor; and circuitry coupled to the memory cells, wherein the circuitry is configured to change a potential of a body of the transistor of each memory cell to a degree depending on a charging state of the body while maintaining a gate electrode of the transistor in a non-addressed state.Join the waitlist — get patent alerts
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