US2009321721A1PendingUtilityA1

High performance field effect transistors comprising carbon nanotubes fabricated using solution based processing

Assignee: GEN ELECTRICPriority: Oct 15, 2004Filed: Apr 25, 2007Published: Dec 31, 2009
Est. expiryOct 15, 2024(expired)· nominal 20-yr term from priority
B82Y 10/00B82Y 30/00Y10S977/742H10K 10/488H10K 10/466H10K 85/761H10K 71/12H10K 85/221H10K 85/113
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Claims

Abstract

The present invention is directed toward field effect transistors (FETs) and thin film transistors (TFTs) comprising carbon nanotubes (CNTs) and to methods of making such devices using solution-based processing techniques, wherein the CNTs within such devices have been fractionated so as to be concentrated in semiconducting CNTs. Additionally, the relatively low-temperature solution-based processing achievable with the methods of the present invention permit the use of plastics in the fabricated devices.

Claims

exact text as granted — not AI-modified
1 - 15 . (canceled) 
     
     
         16 . A field effect transistor comprising:
 a) a plastic substrate;   b) a gate electrode;   c) a dielectric layer in contact with the gate electrode;   d) a semiconducting active material in contact with the dielectric layer, wherein the semiconducting active material comprises carbon nanotubes, the carbon nanotubes having been non-destructively enriched in semiconducting carbon nanotubes; and   e) source and drain electrodes in contact with the semiconducting active material.   
     
     
         17 . The field effect transistor of  claim 16 , wherein the semiconducting active material further comprises material selected from the group consisting of polymeric material, oligomers, single-stranded DNA, polyethylenimine, C60, aromatic organic molecules, and combinations thereof. 
     
     
         18 . The field effect transistor of  claim 16 , wherein the semiconducting active material further comprises a polymeric material in contact with the carbon nanotubes. 
     
     
         19 . The field effect transistor of  claim 18 , wherein the polymeric material has dendritic material attached to it. 
     
     
         20 . The field effect transistor of  claim 16 , wherein the semiconducting active material further comprises a polythiophene material. 
     
     
         21 . The field effect transistor of  claim 16 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-3 cm2/Vsec and about 105 cm2/Vsec. 
     
     
         22 . The field effect transistor of  claim 16 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-1 cm2/Vsec and about 30 cm2/Vsec. 
     
     
         23 . The field effect transistor of  claim 16 , wherein the carbon nanotubes within the semiconducting active material have a density high enough to achieve a percolation threshold. 
     
     
         24 . The field effect transistor of  claim 16 , wherein the transistor is part of a matrix-addressable array, with each node in the array comprising at least one such transistor. 
     
     
         25 . A field effect transistor comprising:
 a) input and output electrodes; and   b) a semiconducting active material coupled to the input and output electrodes, wherein the semiconducting active material comprises carbon nanotubes, the carbon nanotubes having been non-destructively enriched in semiconducting carbon nanotubes.   
     
     
         26 . The field effect transistor of  claim 25 , wherein the substrate is a polymeric material. 
     
     
         27 . The field effect transistor of  claim 25 , wherein the semiconducting active material further comprises material selected from the group consisting of polymeric material, oligomers, single-stranded DNA, polyethylenimine, C60, aromatic organic molecules, and combinations thereof. 
     
     
         28 . The field effect transistor of  claim 25 , wherein the semiconducting active material further comprises a polythiophene material. 
     
     
         29 . The field effect transistor of  claim 25 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-3 cm2/Vsec and about 105 cm2/Vsec. 
     
     
         30 . The field effect transistor of  claim 25 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-1 cm2/Vsec and about 30 cm2/Vsec. 
     
     
         31 . The field effect transistor of  claim 25 , wherein the carbon nanotubes within the semiconducting active material have a density high enough to achieve a percolation threshold. 
     
     
         32 . The field effect transistor of  claim 25 , wherein the transistor is part of a matrix-addressable array, with each node in the array comprising at least one such transistor. 
     
     
         33 . A field effect transistor comprising:
 a) a plastic substrate;   b) a gate electrode;   c) a dielectric layer in contact with the gate electrode;   d) source and drain electrodes; and   e) a semiconducting active material bridging the source and drain electrodes, the material comprising a nanotube network of semiconducting and metallic carbon nanotubes, wherein the nanotube network has a nanotube density sufficient to achieve percolation threshold and below a level that would short the device.   
     
     
         34 . The field effect transistor of  claim 33 , wherein the semiconducting active material further comprises material selected from the group consisting of polymeric material, oligomers, single-stranded DNA, polyethylenimine, C60, aromatic organic molecules, and combinations thereof. 
     
     
         35 . The field effect transistor of  claim 33 , wherein the semiconducting active material further comprises a polythiophene material. 
     
     
         36 . The field effect transistor of  claim 33 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-3 cm2/Vsec and about 105 cm2/Vsec. 
     
     
         37 . The field effect transistor of  claim 33 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-1 cm2/Vsec and about 30 cm2/Vsec. 
     
     
         38 . The field effect transistor of  claim 33 , wherein the transistor is part of a matrix-addressable array, with each node in the array comprising at least one such transistor.

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