US2009321721A1PendingUtilityA1
High performance field effect transistors comprising carbon nanotubes fabricated using solution based processing
Est. expiryOct 15, 2024(expired)· nominal 20-yr term from priority
B82Y 10/00B82Y 30/00Y10S977/742H10K 10/488H10K 10/466H10K 85/761H10K 71/12H10K 85/221H10K 85/113
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Claims
Abstract
The present invention is directed toward field effect transistors (FETs) and thin film transistors (TFTs) comprising carbon nanotubes (CNTs) and to methods of making such devices using solution-based processing techniques, wherein the CNTs within such devices have been fractionated so as to be concentrated in semiconducting CNTs. Additionally, the relatively low-temperature solution-based processing achievable with the methods of the present invention permit the use of plastics in the fabricated devices.
Claims
exact text as granted — not AI-modified1 - 15 . (canceled)
16 . A field effect transistor comprising:
a) a plastic substrate; b) a gate electrode; c) a dielectric layer in contact with the gate electrode; d) a semiconducting active material in contact with the dielectric layer, wherein the semiconducting active material comprises carbon nanotubes, the carbon nanotubes having been non-destructively enriched in semiconducting carbon nanotubes; and e) source and drain electrodes in contact with the semiconducting active material.
17 . The field effect transistor of claim 16 , wherein the semiconducting active material further comprises material selected from the group consisting of polymeric material, oligomers, single-stranded DNA, polyethylenimine, C60, aromatic organic molecules, and combinations thereof.
18 . The field effect transistor of claim 16 , wherein the semiconducting active material further comprises a polymeric material in contact with the carbon nanotubes.
19 . The field effect transistor of claim 18 , wherein the polymeric material has dendritic material attached to it.
20 . The field effect transistor of claim 16 , wherein the semiconducting active material further comprises a polythiophene material.
21 . The field effect transistor of claim 16 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-3 cm2/Vsec and about 105 cm2/Vsec.
22 . The field effect transistor of claim 16 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-1 cm2/Vsec and about 30 cm2/Vsec.
23 . The field effect transistor of claim 16 , wherein the carbon nanotubes within the semiconducting active material have a density high enough to achieve a percolation threshold.
24 . The field effect transistor of claim 16 , wherein the transistor is part of a matrix-addressable array, with each node in the array comprising at least one such transistor.
25 . A field effect transistor comprising:
a) input and output electrodes; and b) a semiconducting active material coupled to the input and output electrodes, wherein the semiconducting active material comprises carbon nanotubes, the carbon nanotubes having been non-destructively enriched in semiconducting carbon nanotubes.
26 . The field effect transistor of claim 25 , wherein the substrate is a polymeric material.
27 . The field effect transistor of claim 25 , wherein the semiconducting active material further comprises material selected from the group consisting of polymeric material, oligomers, single-stranded DNA, polyethylenimine, C60, aromatic organic molecules, and combinations thereof.
28 . The field effect transistor of claim 25 , wherein the semiconducting active material further comprises a polythiophene material.
29 . The field effect transistor of claim 25 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-3 cm2/Vsec and about 105 cm2/Vsec.
30 . The field effect transistor of claim 25 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-1 cm2/Vsec and about 30 cm2/Vsec.
31 . The field effect transistor of claim 25 , wherein the carbon nanotubes within the semiconducting active material have a density high enough to achieve a percolation threshold.
32 . The field effect transistor of claim 25 , wherein the transistor is part of a matrix-addressable array, with each node in the array comprising at least one such transistor.
33 . A field effect transistor comprising:
a) a plastic substrate; b) a gate electrode; c) a dielectric layer in contact with the gate electrode; d) source and drain electrodes; and e) a semiconducting active material bridging the source and drain electrodes, the material comprising a nanotube network of semiconducting and metallic carbon nanotubes, wherein the nanotube network has a nanotube density sufficient to achieve percolation threshold and below a level that would short the device.
34 . The field effect transistor of claim 33 , wherein the semiconducting active material further comprises material selected from the group consisting of polymeric material, oligomers, single-stranded DNA, polyethylenimine, C60, aromatic organic molecules, and combinations thereof.
35 . The field effect transistor of claim 33 , wherein the semiconducting active material further comprises a polythiophene material.
36 . The field effect transistor of claim 33 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-3 cm2/Vsec and about 105 cm2/Vsec.
37 . The field effect transistor of claim 33 , wherein the transistor realizes charge carrier mobility in the semiconductor active region that is between about 10-1 cm2/Vsec and about 30 cm2/Vsec.
38 . The field effect transistor of claim 33 , wherein the transistor is part of a matrix-addressable array, with each node in the array comprising at least one such transistor.Join the waitlist — get patent alerts
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