US2009296506A1PendingUtilityA1
Sense amplifier and data sensing method thereof
Est. expiryMay 28, 2028(~1.8 yrs left)· nominal 20-yr term from priority
G11C 7/065G11C 2207/005
41
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Claims
Abstract
A data sensing method for sensing storage data stored in a memory cell includes the steps of: biasing a sensing node and a reference node to a first voltage in response to a first control signal; discharging the sensing node and the reference node via the memory cell and a reference memory cell, respectively; enabling a latch circuit to amplify a voltage difference between the sensing node and the reference node.
Claims
exact text as granted — not AI-modified1 . A sense amplifier for sensing data stored in a memory cell of a memory, the sense amplifier comprising:
a sensing node; a reference node; a first bias circuit for biasing the sensing node to a first voltage in response to a first control signal; a second bias circuit for biasing the reference node to the first voltage in response to the first control signal; a first transmission circuit for discharging the sensing node via the memory cell; a second transmission circuit for discharging the reference node via a reference memory cell; and a latch circuit for amplifying a voltage difference between the sensing node and the reference node.
2 . The sense amplifier according to claim 1 , further comprising:
a third bias circuit, for biasing the sensing node to a second voltage in response to a third control signal; and
3 . a fourth bias circuit, for biasing the reference node to the second voltage in response to the third control signal. The sense amplifier according to claim 2 , wherein the first, second and third control signals have enabled levels respectively in a first period, a second period and a third period, the third period being between the first and second periods, and the first, second and third periods do not overlap with one another.
4 . The sense amplifier according to claim 2 , wherein the first and second transmission circuits respectively comprise:
a first transistor having a first source/drain coupled to the sensing node, a second source/drain for receiving the cell current and a gate for receiving an enabled signal; and a second transistor having a first source/drain coupled to the reference node, a second source/drain for receiving the reference current and a gate for receiving the enabled signal, wherein the second voltage biases the first and second transistors to operate in saturation regions.
5 . The sense amplifier according to claim 1 , further comprising:
a first switch having a first terminal coupled to the sensing node, and a second terminal coupled to a first input terminal of the latch circuit, wherein the first switch is enabled in response to an enabled level of a fourth control signal to provide a sensing voltage on the sensing node to the latch circuit; and a second switch having a first terminal coupled to the reference node, and a second terminal coupled to a second input terminal of the latch circuit, wherein the second switch is enabled in response to the enabled level of the fourth control signal to provide a reference voltage on the reference node to the latch circuit.
6 . The sense amplifier according to claim 5 , wherein the first, second, third and fourth control signals have enabled levels respectively in a first period, a second period, a third period and a fourth period, the fourth period being after the second period, and the first, second, third and fourth periods do not overlap with one another.
7 . The sense amplifier according to claim 1 , further comprising:
a first capacitor having one terminal coupled to the sensing node and the other terminal for receiving a third voltage; and a second capacitor having one terminal coupled to the reference node and the other terminal for receiving the third voltage.
8 . The sense amplifier according to claim 1 , wherein the latch circuit comprises:
a first inverter having a first input terminal, a first output terminal and a first power input terminal, wherein the first input terminal and the first output terminal are respectively coupled to the sensing node and the reference node; a second inverter having a second input terminal, a second output terminal and a second power input terminal, wherein the second input terminal and the second output terminal are respectively coupled to the reference node and the sensing node; and a first transistor having a first terminal for receiving a fourth voltage and a second terminal coupled to the first and second power input terminals, wherein the first transistor is enabled in response to a fifth control signal to provide the fourth voltage to enable the first and second inverters.
9 . The sense amplifier according to claim 8 , wherein the first and second inverters further respectively have a third power input terminal and a fourth power input terminal, and the latch circuit further comprises:
a second transistor having a first terminal for receiving a fifth voltage and a second terminal coupled to the third and fourth power input terminals, wherein the second transistor is enabled in response to a sixth control signal to provide the fifth voltage to enable the first and second inverters.
10 . A data sensing method for sensing storage data stored in a memory cell of a memory, the data sensing method comprising:
biasing a sensing node and a reference node to a first voltage in response to a first control signal; discharging the sensing node via the memory cell, and discharging the reference node via a reference memory cell; and enabling a latch circuit to amplify a voltage difference between the sensing node and the reference node.
11 . The method according to claim 10 , further comprising:
providing a sensing voltage on the sensing node and a reference voltage on the reference node to the latch circuit through switches respectively.
12 . The method according to claim 10 , further comprising:
biasing the sensing node and the reference node to a second voltage in response to an enabled level of a second control signal.Join the waitlist — get patent alerts
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