US2009213678A1PendingUtilityA1

High yielding, voltage, temperature, and process insensitive lateral poly fuse memory

Individually held — no corporate assignee on recordPriority: Sep 6, 2006Filed: May 3, 2009Published: Aug 27, 2009
Est. expirySep 6, 2026(~0.1 yrs left)· nominal 20-yr term from priority
G11C 17/18
37
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Claims

Abstract

The present invention, generally speaking, provides for a non volatile memory cell requiring no extra process steps. In one embodiment, the non volatile memory cell is a lateral polysilicon programmable read only memory cell, in particular a lateral poly fuse memory cell. Technique are provided to achieve a high yielding, voltage, temperature, and process insensitive lateral poly fuse memory. In one embodiment, a fusible link memory circuit includes a fusible link memory element and a programming circuit. The programming circuit includes a replica of the fusible link memory element and a programming current source for producing a known current density in the fusible link memory element in spite of variations including at least process variations.

Claims

exact text as granted — not AI-modified
1 .- 14 . (canceled) 
   
   
       15 . A constant current density current source comprising: a constant voltage source for producing a constant voltage; and means for applying the constant voltage to resistive element.

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