Testing/adjusting method and test control apparatus for rotating disk storage devices

Abstract

Embodiments of the invention provide a method of testing/adjusting magnetic disk devices, in which the method allows the tests/adjustments to be conducted by solving problems due to the data sizes and characteristics of test/adjustment programs. After assembly of a magnetic disk device, setup of various parameters, magnetic disk defect registration, and other test/adjustment steps are executed. Execution of the test/adjustment programs does not require a special test apparatus since they are executed in the magnetic disk device to be tested. In addition, the test/adjustment programs are formed up of multiple phases, and each phase is sequentially executed. Adoption of this program structure keeps the tests/adjustments clear from restrictions due to the data sizes and characteristics of the test/adjustment programs.

1 - 12 . (canceled) 
   
   
       13 . A test control apparatus comprising:
 a first ATA interface connector configured to connect a first magnetic disk device in which a test/adjustment program is stored;   a plurality of second ATA interface connectors each configured to connect any one of a plurality of second magnetic disk devices to be tested/adjusted;   a plurality of bus switches each connected to any one of the plural second ATA interface connectors at one end, and connected to the first ATA interface connector at the other end; and   a bus controller connected to the first ATA interface connector and any one of the bus switches so as to conduct control to close any one of the bus switches by executing a command transferred from the first magnetic disk device.   
   
   
       14 . The test control apparatus according to  claim 13 , wherein the bus controller includes a device setter configured to set either a master or a slave. 
   
   
       15 . The test control apparatus according to  claim 13 , wherein the bus switch includes a first bus switch and a second bus switch and wherein, when the first bus switch is in a closed condition and the second bus switch is in an open condition, the bus controller, by executing an ATA command sent from the first magnetic disk device, opens the first bus switch and closes the second bus switch. 
   
   
       16 . The test control apparatus according to  claim 15 , wherein the bus switch includes a third bus switch and wherein, when the bus controller detects that the second magnetic disk device associated with the second bus switch is in a busy condition, the bus controller opens the second bus switch and closes the third bus switch. 
   
   
       17 . The test control apparatus according to  claim 15 , wherein the bus switch includes a third bus switch and wherein, when the bus controller detects that neither the first magnetic disk device nor any of the second plural magnetic disk devices is connected to the second bus switch, the bus controller opens the second bus switch and closes the third bus switch. 
   
   
       18 . The test control apparatus according to  claim 13 , further comprising a display section configured to display the fact that the second magnetic disk device has completed execution of the test/adjustment program. 
   
   
       19 . The test control apparatus according to  claim 13 , further comprising a display section configured to display the fact that an error has occurred in the second magnetic disk device. 
   
   
       20 . The test control apparatus according to  claim 13 , further comprising a display section configured to display an execution status of the test/adjustment program within the second magnetic disk device.