Semiconductor device and method for manufacturing the same, and electric device
Abstract
It is an object of the present invention to simplify steps needed to process a wiring in forming a multilayer wiring. In addition, when a droplet discharging technique or a nanoimprint technique is used to form a wiring in a contact hole having a comparatively long diameter, the wiring in accordance with the shape of the contact hole is formed, and the wiring portion of the contact hole is likely to have a depression compared with other portions. A penetrating opening is formed by irradiating a light-transmitting insulating film with laser light having high intensity and a pulse high in repetition frequency. A plurality of openings having a minute contact area is provided instead of forming one penetrating opening having a large contact area to have an even thickness of a wiring by reducing a partial depression and also to ensure contact resistance.
Claims
exact text as granted — not AI-modified1 . An active matrix display device comprising:
a thin film transistor formed over a substrate, the thin film transistor comprising:
a gate electrode;
a gate insulating film formed over the gate electrode; and
a semiconductor film comprising a metal oxide wherein the metal includes In;
an insulating film comprising an inorganic material formed on the semiconductor film; and a pixel electrode formed on the insulating film and electrically connected to the thin film transistor.
2 . The active matrix display device according to claim 1 , wherein the insulating film comprises silicon nitride or silicon nitride oxide.
3 . An active matrix liquid crystal display device comprising:
a thin film transistor formed over a substrate, the thin film transistor comprising:
a gate electrode;
a gate insulating film formed over the gate electrode; and
a semiconductor film comprising a metal oxide wherein the metal includes In;
an insulating film comprising an inorganic material formed on the semiconductor film; and a pixel electrode formed on the insulating film and electrically connected to the thin film transistor.
4 . The active matrix liquid crystal display device according to claim 3 , wherein the insulating film comprises silicon nitride or silicon nitride oxide.
5 . An active matrix EL display device comprising:
a thin film transistor formed over a substrate, the thin film transistor comprising:
a gate electrode;
a gate insulating film formed over the gate electrode; and
a semiconductor film comprising a metal oxide wherein the metal includes In;
an insulating film comprising an inorganic material formed on the semiconductor film; and a pixel electrode formed on the insulating film and electrically connected to the thin film transistor.
6 . The active matrix EL display device according to claim 5 , wherein the insulating film comprises silicon nitride or silicon nitride oxide.
7 . An active matrix display device comprising:
a thin film transistor formed over a substrate, the thin film transistor comprising:
a gate electrode;
a gate insulating film formed over the gate electrode; and
a semiconductor film comprising a metal oxide wherein the metal includes In;
an insulating film comprising a resin material formed on the semiconductor film; and a pixel electrode formed on the insulating film and electrically connected to the thin film transistor.
8 . The active matrix display device according to claim 7 , wherein the insulating film comprises a material selected from the group consisting of epoxy resin, acrylic resin, phenol resin, novolac resin, melamine resin, and urethane resin.
9 . An active matrix liquid crystal display device comprising:
a thin film transistor formed over a substrate, the thin film transistor comprising:
a gate electrode;
a gate insulating film formed over the gate electrode; and
a semiconductor film comprising a metal oxide wherein the metal includes In;
an insulating film comprising a resin material formed on the semiconductor film; and a pixel electrode formed on the insulating film and electrically connected to the thin film transistor.
10 . The active matrix liquid crystal display device according to claim 9 , wherein the insulating film comprises a material selected from the group consisting of epoxy resin, acrylic resin, phenol resin, novolac resin, melamine resin, and urethane resin.
11 . An active matrix EL display device comprising:
a thin film transistor formed over a substrate, the thin film transistor comprising:
a gate electrode;
a gate insulating film formed over the gate electrode; and
a semiconductor film comprising a metal oxide wherein the metal includes In;
an insulating film comprising a resin material formed on the semiconductor film; and a pixel electrode formed on the insulating film and electrically connected to the thin film transistor.
12 . The active matrix EL display device according to claim 11 , wherein the insulating film comprises a material selected from the group consisting of epoxy resin, acrylic resin, phenol resin, novolac resin, melamine resin, and urethane resin.
13 . An active matrix display device comprising:
a thin film transistor formed over a substrate, the thin film transistor comprising:
a gate electrode;
a gate insulating film formed over the gate electrode; and
a semiconductor film comprising a metal oxide wherein the metal includes In;
an insulating film comprising a siloxane-based polymer formed on the semiconductor film; and a pixel electrode formed on the insulating film and electrically connected to the thin film transistor.
14 . An active matrix liquid crystal display device comprising:
a thin film transistor formed over a substrate, the thin film transistor comprising:
a gate electrode;
a gate insulating film formed over the gate electrode; and
a semiconductor film comprising a metal oxide wherein the metal includes In;
an insulating film comprising a siloxane-based polymer formed on the semiconductor film; and a pixel electrode formed on the insulating film and electrically connected to the thin film transistor.
15 . An active matrix EL display device comprising:
a thin film transistor formed over a substrate, the thin film transistor comprising:
a gate electrode;
a gate insulating film formed over the gate electrode; and
a semiconductor film comprising a metal oxide wherein the metal includes In;
an insulating film comprising a siloxane-based polymer formed on the semiconductor film; and a pixel electrode formed on the insulating film and electrically connected to the thin film transistor.
16 . The active matrix display device according to any one of claims 1 , 7 or 13 wherein the metal oxide includes zinc, gallium, and indium.
17 . The active matrix liquid crystal display device according to any one of claims 3 , 9 or 14 wherein the metal oxide includes zinc, gallium, and indium.
18 . The active matrix EL display device according to any one of claims 5 , 11 or 15 wherein the metal oxide includes zinc, gallium, and indium.
19 . The active matrix display device according to any one of claims 1 , 7 or 13 wherein the substrate is a plastic substrate.
20 . The active matrix liquid crystal display device according to any one of claims 3 , 9 or 14 wherein the substrate is a plastic substrate.
21 . The active matrix EL display device according to any one of claims 5 , 11 or 15 wherein the substrate is a plastic substrate.
22 . The active matrix display device according to any one of claims 1 , 7 or 13 wherein the substrate is a glass substrate.
23 . The active matrix liquid crystal display device according to any one of claims 3 , 9 or 14 wherein the substrate is a glass substrate.
24 . The active matrix EL display device according to any one of claims 5 , 11 or 15 wherein the substrate is a glass substrate.
25 . The active matrix display device according to any one of claims 1 , 7 or 13 wherein the insulating film directly contacts an upper surface of the semiconductor film.
26 . The active matrix liquid crystal display device according to any one of claims 3 , 9 or 14 wherein the insulating film directly contacts an upper surface of the semiconductor film.
27 . The active matrix EL display device according to any one of claims 5 , 11 or 15 wherein the insulating film directly contacts an upper surface of the semiconductor film.Join the waitlist — get patent alerts
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