Semiconductor integrated circuit apparatus, measurement result management system, and management server

Abstract

A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.

1 . A management server arranged on an identical chip to that of a main frame circuit that is an object of measurement, said management server managing a measurement result of said measurement circuit that is transmitted from a semiconductor integrated circuit apparatus having a measurement circuit for measuring a physical amount of said main frame circuit at the time of an actual operation of said main frame circuit, having:
 reception means for receiving the transmitted measurement result, and identification information for uniquely identifying said main frame circuit; and   management means for managing said received measurement result identification information by identification information.   
   
   
       2 . The management server according to  claim 1 , wherein in a case where the transmitted measurement result and identification information were encrypted, said reception means have decoding means for decoding the encrypted measurement result and identification information. 
   
   
       3 . The management server according to  claim 2 , having monitor means for giving a fault warning of said main frame circuit, based upon the measurement result that said management means manage.