Method and Device for Optically Scanning a Sample
Abstract
The invention relates to a method and a device for optically scanning a sample, especially using a microscope. To this end, an adjustment unit and a scanning device are provided. The sample is displaced in relation to the scanning device by means of the adjustment unit which is acted upon by a control installation, or vice versa. According to the invention, a displacement window is defined for the adjustment unit and/or the scanning device, inside which mechanical collisions between the sample and the scanning device are prevented. This is especially advantageous in biological samples. A non-contact sample sensor is provided for the prevention of collisions, the sensor operating, for example, by electromagnetic or acoustic waves.
Claims
exact text as granted — not AI-modified1 . Method for optically scanning a sample ( 1 ), having an adjustment unit ( 2 , 3 ) and a scanning device ( 4 , 5 ), according to which method the sample ( 1 ) is moved relative to the scanning device ( 4 , 5 ), by means of the adjustment unit ( 2 , 3 ) activated by a control system ( 7 ), or vice versa, and according to which method a movement window (F) for the adjustment unit ( 2 , 3 ) and/or the scanning device ( 4 , 5 ) is defined by means of a sample sensor ( 8 ), within which window mechanical collisions between the sample ( 1 ) and the scanning device ( 4 , 5 ) are precluded, wherein the sample sensor ( 8 ) works in contact-free manner, for example with recourse to electromagnetic waves and/or sound waves.
2 . Method according to claim 1 , wherein the movement window (F) is adjusted, in variable manner, as a function of various parameters such as the size of the sample ( 1 ), the starting position and speed of the adjustment unit ( 2 , 3 ) and/or the scanning device ( 4 , 5 ), as well as their configuration, if applicable.
3 . Method according to claim 1 , wherein the movement window (F) limits movements of the adjustment unit ( 2 , 3 ) and/or the scanning device ( 4 , 5 ) in one dimension.
4 . Method according to claim 1 , wherein the sample sensor ( 8 ) reports distance measurement values between the sample ( 1 ) and/or the adjustment unit ( 2 , 3 ) and the scanning device ( 4 , 5 ) to the control system ( 7 ), once or continuously.
5 . Method according to claim 1 , wherein in addition to the sample sensor ( 8 ), an adjustment sensor ( 9 ) is implemented, which detects movements of the adjustment unit ( 2 , 3 ).
6 . Device for optically scanning a sample ( 1 ), having an adjustment unit ( 2 , 3 ) and a scanning device ( 4 , 5 ), whereby the sample ( 1 ) is moved relative to the scanning device ( 4 , 5 ), by means of the adjustment unit ( 2 , 3 ) activated by a control system ( 7 ), or vice versa, and according to which a movement window (F) for the adjustment unit ( 2 , 3 ) and/or the scanning device ( 4 , 5 ) is defined by means of a sample sensor ( 8 ), within which window mechanical collisions between the sample ( 1 ) and the scanning device ( 4 , 5 ) are precluded, wherein the sample sensor ( 8 ) works in contact-free manner, for example with recourse to electromagnetic waves and/or sound waves.
7 . Device according to claim 6 , wherein the sample sensor ( 8 ) detects a free space present between the sample ( 1 ) and the scanning device ( 4 , 5 ).
8 . Device according to claim 6 , wherein the sample sensor ( 8 ) additionally or alternatively scans the sample ( 1 ).
9 . Device according to claim 6 , wherein an adjustment sensor ( 9 ) is provided in addition to the sample sensor ( 8 ).
10 . Device according to claim 6 , wherein the adjustment sensor ( 9 ) is assigned to one or more adjustment devices ( 2 , 6 ) of the adjustment unit ( 2 , 3 ).Join the waitlist — get patent alerts
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