US2009041185A1PendingUtilityA1

Angled-beam detection system for container inspection

Assignee: SCANTECH HOLDINGS LLCPriority: Oct 22, 2004Filed: Mar 28, 2008Published: Feb 12, 2009
Est. expiryOct 22, 2024(expired)· nominal 20-yr term from priority
G01N 2223/406G01N 23/083G01N 2223/1016G01N 23/044G01N 2223/639G01V 5/224G01V 5/228
50
PatentIndex Score
0
Cited by
0
References
0
Claims

Abstract

A non-intrusive inspection system, including apparatuses and methods, for non-intrusively inspecting containers such as, without limitation, those employed to transport items in international commerce. The non-intrusive inspection system is configured to generate and scan a container with multiple bremsstrahlung, or x-ray, beams having multiple spectra and directed at the container in multiple directions and planes separated by one or more angle(s). Using data collected from such scanning, software of the non-intrusive inspection system generates three-dimensional images of the items present in a container, calculates the volumes and densities of such items, computes effective “Z” numbers, and distinguishes between multiple materials, or elements, of such items. By employing multiple bremsstrahlung beams directed upon a container in multiple planes, the non-intrusive inspection system reduces the number of orientations and geometries of items within a container that might otherwise be employed to avoid the detection of harmful materials being transported within a container.

Claims

exact text as granted — not AI-modified
1 . A method for non-intrusively inspecting a container used for the transportation of an item therein, said apparatus comprising:
 (a) scanning a container and an item therein with a first x-ray beam at a first angle relative to the container;   (b) scanning the container and the item therein with a second x-ray beam at a second angle relative to the container, wherein the second angle has an angular measure different than the first angle relative to the container;   (c) producing first data representative of a portion of the first x-ray beam that passes through the container and the item therein;   (d) producing second data representative of a portion of the second x-ray beam that passes through the container and the item therein; and   (e) determining a characteristic of the item based at least in part on said first data and said second data.

Join the waitlist — get patent alerts

Track US2009041185A1 — get alerts on status changes and closely related new filings.

We store only your email — no account needed. See our privacy policy.