US2008308845A1PendingUtilityA1

Heterogeneous Group IV Semiconductor Substrates

Assignee: SAMSUNG ELECTRONICS CO LTDPriority: Mar 16, 2004Filed: Aug 21, 2008Published: Dec 18, 2008
Est. expiryMar 16, 2024(expired)· nominal 20-yr term from priority
A47G 1/02A47G 2001/005A47G 1/00H10D 30/60H10D 62/116
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Claims

Abstract

Embodiments of the present invention include heterogeneous substrates, integrated circuits formed on such heterogeneous substrates. The heterogeneous substrates according to certain embodiments of the present invention include a first Group IV semiconductor layer (e.g., silicon), a second Group IV pattern (e.g., a silicon-germanium pattern) that includes a plurality of individual elements on the first Group IV semiconductor layer, and a third Group IV semiconductor layer (e.g., a silicon epitaxial layer) on the second Group IV pattern and on a plurality of exposed portions of the first Group IV semiconductor layer. The second Group IV pattern may be removed in embodiments of the present invention. In these and other embodiments of the present invention, the third Group IV semiconductor layer may be planarized.

Claims

exact text as granted — not AI-modified
1 . A heterogeneous semiconductor substrate, comprising:
 a first Group IV semiconductor layer;   a second Group IV semiconductor pattern that includes a plurality of individual elements on the first Group IV semiconductor layer; and   a third Group IV semiconductor layer having a planarized upper surface on the second Group IV semiconductor pattern and on a plurality of exposed portions of the first Group IV semiconductor layer;   wherein the planarized upper surface of the third Group IV semiconductor layer comprises the upper surface of the heterogeneous semiconductor substrate.   
   
   
       2 . The heterogeneous semiconductor substrate of  claim 1 , wherein the first Group IV semiconductor layer comprises a single crystalline silicon substrate, the second Group IV semiconductor pattern comprises a silicon-germanium epitaxial pattern, and the third Group IV semiconductor layer comprises a silicon epitaxial layer. 
   
   
       3 . The heterogeneous semiconductor substrate of  claim 1 , wherein the first and third Group IV semiconductor layers comprise a first material and the second Group IV semiconductor pattern comprises a second material that has different electrical and chemical properties than the first material. 
   
   
       4 . The heterogeneous semiconductor substrate of  claim 1 , wherein the third Group IV semiconductor layer is directly on the first Group IV semiconductor layer in exposed areas between the individual elements of the second Group IV semiconductor pattern.

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