Process for preparing a bonding type semiconductor substrate
Abstract
The process comprises a step of growing epitaxially mixed crystals of a compound semiconductor represented by the composition formula In x (Ga 1-y Al y ) 1-x P on a GaAs substrate 12 to form an epi-wafer having an n-type cladding layer 14 (0.45≦x≦0.50, 0≦y≦1), an active layer 15 , a p-type cladding layer 16 and a cover layer 17 ; a step of removing the cover layer 17 by etching to expose the surface of the p-type cladding layer 16 ; a step of integrally joining a mirror-finished GaP substrate 11 on the p-type cladding layer 16 by placing the GaP substrate on the cladding layer at room temperature so that the mirror-finished surface of the GaP substrate may come into contact with the p-type cladding layer 16 ; a step of subjecting the resultant laminate to a heat treatment; a step of carrying out an etching treatment from the side of the GaAs substrate 12 to expose the n-type cladding layer 14 ; and a step of forming electrodes 19 on the surface of the n-type cladding layer 14 and on the back surface of the GaP substrate 11 , respectively.
Claims
exact text as granted — not AI-modified1 - 17 . (canceled)
18 : A semiconductor light emitting element comprising: a substrate having a transparency to emission which is emitted from an active layer;
a laminate provided on an upper surface of the substrate so that a part of the upper surface of the substrate is exposed, the laminate including the active layer; a first electrode provided on an upper surface of the laminate; and a second electrode provided on a lower surface of the substrate, the lower surface being opposite to the upper surface, a light take-out portion being provided on a side of the upper surface of the substrate.
19 : The semiconductor light emitting element according to claim 18 , wherein the first electrode is formed to cover only a part of the upper surface of the laminate.
20 : The semiconductor light emitting element according to claim 18 , wherein the first electrode is formed to cover entirety of the upper surface of the laminate.
21 : The semiconductor light emitting element according to claim 20 , wherein a ball of a wire is provided on the first electrode, the ball having a size which is substantially same as the first electrode.
22 : The semiconductor light emitting element according to claim 18 , wherein the second electrode is formed to cover substantially entirety of the lower surface of the substrate.
23 : The semiconductor light emitting element according to claim 18 , wherein a step is formed on a side of the upper surface of the substrate.
24 : The semiconductor light emitting element according to claim 23 , wherein a size of the laminate is substantially same as a size of an upper surface of the step.
25 : The semiconductor light emitting element according to claim 18 , wherein
the substrate comprises GaP as a main component, and the active layer comprises InGaAlP as a main component.
26 : A process for preparing a bonding type semiconductor substrate, comprising:
a first step of forming a first epitaxial growth layer by epitaxially growing a semiconductor crystal on an etching stop layer which is formed on a first semiconductor substrate; a second step of integrally joining to the first epitaxial growth layer a second semiconductor substrate which has at least one surface mirror-polished, by placing the second semiconductor substrate on the first epitaxial growth layer so that the second semiconductor substrate may come into a contact with the first epitaxial growth layer via the mirror-polished surface or a second epitaxial growth layer grown on the mirror-polished surface, thereby producing a resultant laminate; and a third step of subjecting the resultant laminate to a heat treatment after at least part of a surface of the first semiconductor substrate has been removed therefrom.
27 : The process for preparing the bonding type semiconductor substrate according to claim 26 , wherein the first step includes a step of removing a surface of the first epitaxial growth layer.
28 : The process for preparing a bonding type semiconductor substrate according to claim 26 , wherein the first and second semiconductor substrates are joined by heating them, while only a part of the laminated first and second semiconductor substrates are pressed and other parts of the first and second semiconductor substrate are not pressed.
29 : The process for preparing the bonding type semiconductor substrate according to claim 28 , wherein only a central part of the laminated first and second semiconductor substrates are pressed.
30 : The process for preparing the bonding type semiconductor substrate according to claim 26 , wherein
the first semiconductor substrate and the second semiconductor substrate are made of a compound semiconductor, and the first and the second semiconductor substrates are joined by opposing a surface where an A plane preferentially appears in a main surface of the second semiconductor substrate to a surface where the B plane preferentially appears in a main surface of the first epitaxial growth layer, or by opposing a surface where the B plane preferentially appears in a main surface of the second semiconductor substrate to a surface where the A plane preferentially appears in a main surface of the first epitaxial growth layer.
31 : The process for preparing the bonding type semiconductor substrate according to claim 26 , wherein the first and the second semiconductor substrates are joined so that a forward mesa direction on a opposing surface of the first semiconductor substrate and a forward mesa direction on a opposing surface of the second semiconductor substrate are orthogonal.
32 : A process for preparing a semiconductor light emitting element comprising:
a step of forming an etching stop layer on a first semiconductor substrate, and forming a first epitaxial growth layer including a laminate having a first cladding layer, an active layer and a second cladding layer deposited in this order by epitaxially growing a mixed crystal of compound semiconductor on the etching stop layer; a step of integrally joining to the first epitaxial growth layer a second semiconductor substrate which has at least one surface mirror-polished, by placing the second semiconductor substrate on the first epitaxial growth layer so that the second semiconductor substrate may come into contact with the first epitaxial growth layer via the mirror-polished surface or a second epitaxial growth layer grown on the mirror-polished surface, thereby producing a resultant laminate; a step of subjecting the resultant laminate to a heat treatment after at least part of a surface of the first semiconductor substrate has been removed therefrom; a step of exposing the first epitaxial growth layer by etching; and a step of forming electrodes on a side of the exposed surface of the first epitaxial growth layer and on a backside of the second semiconductor substrate.
33 : The process for preparing the semiconductor light emitting element according to claim 32 , further comprising
a step of forming a cover layer on the first epitaxial growth layer; and a step of exposing a surface of the first epitaxial growth layer by removing the cover layer.
34 : The process for preparing the semiconductor light emitting element according to claim 32 , wherein the first and second semiconductor substrates are joined by heating them, while only a part of the laminated first and second semiconductor substrates are pressed and other parts of the first and second semiconductor substrate are not pressed.
35 : The process for preparing the semiconductor light emitting element according to claim 34 , wherein only a central part of the laminated first and second semiconductor substrates are pressed.
36 : The process for preparing the semiconductor light emitting element according to claim 32 , wherein
the first semiconductor substrate and the second semiconductor substrate are made of compound semiconductor, and the first and the second semiconductor substrates are joined by opposing a surface where an A plane preferentially appears in a main surface of the second semiconductor substrate to a surface where a B plane preferentially appears in a main surface of the first epitaxial growth layer, or by opposing a surface where the B plane preferentially appears in a main surface of the second semiconductor substrate to a surface where the A plane preferentially appears in a main surface of the first epitaxial growth layer.
37 : The process for preparing the semiconductor light emitting element according to claim 32 , wherein the first and the second semiconductor substrates axe joined so that a forward mesa direction on a opposing surface of the first semiconductor substrate and a forward mesa direction on a opposing surface of the second semiconductor substrate are orthogonal.Join the waitlist — get patent alerts
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