US2008211105A1PendingUtilityA1
Method of assembling chips
Est. expiryOct 25, 2022(expired)· nominal 20-yr term from priority
H10W 90/756H10W 90/754H10W 90/736H10W 90/734H10W 90/724H10W 90/722H10W 74/15H10W 74/00H10W 72/9415H10W 72/01271H10W 72/01255H10W 72/01235H10W 72/01215H10W 72/951H10W 72/884H10W 72/536H10W 72/255H10W 72/252H10W 72/223H10W 72/222H10W 72/075H10W 72/073H10W 72/072H10W 72/29H10W 70/681H10W 90/00H10W 70/60H10W 72/20
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Claims
Abstract
A method of assembling chips. A first chip and a second chip are provided. At least one conductive pillar is formed on the first chip, and a conductive connecting material is formed on the conductive pillar. The second chip also comprises at least one conductive pillar. The first chip is connected to the second chip via the conductive pillars and the conductive connecting material.
Claims
exact text as granted — not AI-modified1 - 20 . (canceled)
21 . A chip package comprising:
a first substrate; a chip over said first substrate; a copper pillar between said chip and said first substrate, wherein said copper pillar has a thickness greater than a vertical distance between said copper pillar and said first substrate; and a tin-containing layer between said copper pillar and said first substrate and on a sidewall of said copper pillar.
22 . The chip package of claim 21 , wherein said tin-containing layer comprises silver.
23 . The chip package of claim 21 , wherein said tin-containing layer comprises lead.
24 . The chip package of claim 21 , wherein said copper pillar is between a pad of said chip and said first substrate, wherein said copper pillar is connected to said pad, and wherein said copper pillar has a transverse dimension less than that of said pad.
25 . The chip package of claim 21 further comprising an encapsulating material between said chip and said first substrate, wherein said encapsulating material contacts with said chip and said first substrate.
26 . The chip package of claim 21 further comprising a second substrate and a metal bump between said chip and said second substrate.
27 . The chip package of claim 26 further comprising a solder ball under said second substrate, wherein said solder ball is connected to said second substrate, and wherein said chip is over said second substrate.
28 . The chip package of claim 21 , wherein said first substrate comprises a ceramic substrate.
29 . A chip package comprising:
a first substrate; a chip over said first substrate; a copper pillar between said chip and said first substrate, wherein said copper pillar has a thickness greater than a vertical distance between said copper pillar and said first substrate; a tin-and-gold-containing layer between said copper pillar and said first substrate, wherein said thickness of said copper pillar is greater than that of said tin-and-gold-containing layer; and a tin-containing layer on a sidewall of said copper pillar.
30 . The chip package of claim 29 , wherein said tin-containing layer comprises silver.
31 . The chip package of claim 29 , wherein said tin-containing layer comprises lead.
32 . The chip package of claim 29 , wherein said copper pillar is between a pad of said chip and said first substrate, wherein said copper pillar is connected to said pad, and wherein said copper pillar has a transverse dimension less than that of said pad.
33 . The chip package of claim 29 further comprising an encapsulating material between said chip and said first substrate, wherein said encapsulating material contacts with said chip and said first substrate.
34 . The chip package of claim 29 further comprising a second substrate and a metal bump between said chip and said second substrate.
35 . The chip package of claim 34 further comprising a solder ball under said second substrate, wherein said solder ball is connected to said second substrate, and wherein said chip is over said second substrate.
36 . The chip package of claim 29 , wherein said first substrate comprises a ceramic substrate.
37 . A chip package comprising:
a substrate; a chip over said substrate; a copper pillar between said chip and said substrate, wherein said copper pillar has a thickness greater than a vertical distance between said copper pillar and said substrate; and a tin-containing layer between said chip and said substrate, wherein said tin-containing layer covers a bottom surface of said copper pillar and a sidewall of said copper pillar.
38 . The chip package of claim 37 , wherein said tin-containing layer comprises silver.
39 . The chip package of claim 37 , wherein said tin-containing layer comprises lead.
40 . The chip package of claim 37 , wherein said copper pillar is between a pad of said chip and said substrate, wherein said copper pillar is connected to said pad, and wherein said copper pillar has a transverse dimension less than that of said pad.Join the waitlist — get patent alerts
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