System and Method for Early Qualification of Semiconductor Devices

Abstract

According to one embodiment of the invention, a method for early qualification of semiconductor device includes performing initial testing on a semiconductor device, receiving fail data on the semiconductor device, determining a solution model for the semiconductor device based on the fail data, storing the solution model, performing subsequent testing on the semiconductor device, and comparing a result of the subsequent testing to the solution model.

1 . A method for early qualification of semiconductor devices, comprising:
 placing a semiconductor device in a test equipment;   performing initial testing on a semiconductor device;   receiving fail data on the semiconductor device;   determining a solution model for the semiconductor device based on the fail data using a virtual repair tool;   storing the solution model;   performing subsequent testing on the semiconductor device using the solution model from the virtual repair tool;   comparing a result of the subsequent testing to the solution model to form a comparison result; and   storing the comparison result in a memory device.   
   
   
       2 . The method of  claim 1 , further comprising:
 determining one or more failures of the semiconductor device from the result of the subsequent testing; and   identifying an improvement to a process for manufacturing the semiconductor device based on the fail data or the determined one or more failures.   
   
   
       3 - 4 . (canceled) 
   
   
       5 . The method of  claim 1 , wherein the fail data comprises failed bits and determining the solution model comprises masking the failed bits. 
   
   
       6 . The method of  claim 1 , wherein the fail data comprises failed bits and determining the solution model comprises masking the failed bits and designating spare bits to use in place of the failed bits. 
   
   
       7 . The method of  claim 1 , further comprising performing an actual repair operation on the semiconductor device after the subsequent testing. 
   
   
       8 . The method of  claim 1 , wherein the semiconductor device is a memory chip. 
   
   
       9 . Computer readable media encoded with a computer program for early qualification of semiconductor devices, operable to:
 receive fail data on a semiconductor device from initial testing;   determine a virtual solution model for the semiconductor device based on the fail data;   store the virtual solution model; and   compare a result of subsequent testing performed on the semiconductor device to the virtual solution model to form a comparison result, wherein the subsequent testing is performed prior to an actual repair of the semiconductor device; and   storing the comparison result in a memory device.   
   
   
       10 . The logic of  claim 9 , further operable to:
 determine one or more failures of the semiconductor device from the result of the subsequent testing; and   identify an improvement to a process for manufacturing the semiconductor device based on the fail data or the determined one or more failures.   
   
   
       11 - 12 . (canceled) 
   
   
       13 . The logic of  claim 9 , wherein the fail data comprises failed bits and the logic is further operable to mask the failed bits. 
   
   
       14 . The logic of  claim 9 , wherein the fail data comprises failed bits and the logic is further operable to mask the failed bits and designate spare bits to use in place of the failed bits. 
   
   
       15 . The logic of  claim 9 , wherein the semiconductor device is a memory chip. 
   
   
       16 - 20 . (canceled)