US2008160330A1PendingUtilityA1
Copper-elastomer hybrid thermal interface material to cool under-substrate silicon
Est. expiryDec 29, 2026(~0.4 yrs left)· nominal 20-yr term from priority
Inventors:David W. SongKelly LofgreenBarrett M. FaneufChia-Pin ChiuStephen MontgomeryTodd YoungSeth J. E. Reynolds
Y10T428/12007B32B 15/08C22C 9/00H10W 90/724H10W 72/877H10W 40/258H10W 40/251H10W 40/73H10W 90/00H10W 40/255
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Claims
Abstract
In some embodiments, copper-elastomer hybrid thermal interface material to cool under-substrate silicon is presented. In this regard, an apparatus is introduced having a layer of copper, a layer of elastomer, and a layer of thin film thermal interface material between the copper and elastomer layers. Other embodiments are also disclosed and claimed.
Claims
exact text as granted — not AI-modified1 . An apparatus comprising:
a layer of copper; a layer of elastomer; and a layer of thin film thermal interface material between the copper and elastomer layers.
2 . The apparatus of claim 1 , wherein the thin film thermal interface material comprises a principal material chosen from the group consisting of: thermal grease, phase-change material, and solder alloy.
3 . The apparatus of claim 2 , further comprising layers of thin film thermal interface material on outside mating surfaces of the copper and elastomer layers.
4 . The apparatus of claim 3 , wherein the elastomer layer has a bulk thermal conductivity of about 3 W/m C.
5 . The apparatus of claim 3 , further comprising an elastomer layer height of about 2 mm uncompressed.
6 . The apparatus of claim 4 , wherein the elastomer layer height is designed to be about 1 mm compressed.
7 . The apparatus of claim 3 , wherein the copper layer has a thickness of about 2 mm.
8 . The apparatus of claim 3 , further comprising a length of about 15 mm.
9 . The apparatus of claim 3 , further comprising a width of about 10 mm.
10 . An electronic appliance comprising:
a network controller; a system memory; a processor, wherein the processor includes an under-substrate silicon die; and a thermal interface material coupled with the under-substrate silicon die, the thermal interface material comprising a layer of copper, a layer of elastomer, and a layer of thin film thermal interface material between the copper and elastomer layers.
11 . The electronic appliance of claim 10 , further comprising layers of thin film thermal interface material on outside mating surfaces of the copper and elastomer layers.
12 . The electronic appliance of claim 11 , wherein the thin film thermal interface material comprises a principal material chosen from the group consisting of: thermal grease, phase-change material, and solder alloy.
13 . The electronic appliance of claim 12 , wherein the elastomer layer has a bulk thermal conductivity of about 3 W/m C.
14 . The electronic appliance of claim 12 , further comprising a thermal interface material height of about 4 mm uncompressed.
15 . The electronic appliance of claim 14 , wherein the thermal interface material height is designed to be about 3 mm when compressed.Join the waitlist — get patent alerts
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