Etching apparatus for edges of substrate
Abstract
An etching apparatus comprises a chamber; a substrate supporter in the chamber; a substrate disposed on the substrate and having one of a notch zone and a flat zone, the substrate having a rim of a circular shape except in the one of the notch zone and the flat zone, wherein the rim of the substrate has a dented shape in the notch zone and a chord shape in the flat zone; a substrate-screening unit having a substantially same shape as the substrate and disposed over the substrate, the substrate-screening unit having a portion corresponding to the one of the notch zone and the flat zone, wherein the substrate-screening unit has a first diameter smaller than or equal to a second diameter of the substrate; a gas injection means supplying gases onto a periphery of the substrate; and a power supply unit supplying an RF (radio frequency) power into the chamber.
Claims
exact text as granted — not AI-modified1 . An etching apparatus, comprising:
a chamber; a substrate supporter in the chamber; a substrate disposed on the substrate and having one of a notch zone and a flat zone, the substrate having a rim of a circular shape except in the one of the notch zone and the flat zone, wherein the rim of the substrate has a dented shape in the notch zone and a chord shape in the flat zone; a substrate-screening unit having a substantially same shape as the substrate and disposed over the substrate, the substrate-screening unit having a portion corresponding to the one of the notch zone and the flat zone, wherein the substrate-screening unit has a first diameter smaller than or equal to a second diameter of the substrate; a gas injection means supplying gases onto a periphery of the substrate; and a power supply unit supplying an RF (radio frequency) power into the chamber.
2 . The apparatus according to claim 1 , wherein the substrate-screening unit comprises:
a first body; and a second body having the first diameter greater than a diameter of the first body, wherein the portion of the substrate-screening unit is formed at a side of the second body.
3 . The apparatus according to claim 2 , wherein the first and second bodies are integrated as a single body.
4 . The apparatus according to claim 1 , wherein when the substrate has the notch zone, the portion of the substrate-screening unit has a greater width and a smaller depth than the notch zone.
5 . The apparatus according to claim 1 , wherein when the substrate has the notch zone, the portion of the substrate-screening unit has a smaller width and a smaller depth than the notch zone.
6 . The apparatus according to claim 1 , wherein the gas injection means is disposed on an upper side of the chamber to seal up the chamber, and the substrate-screening unit protrudes from the gas injection means toward the substrate.
7 . The apparatus according to claim 6 , wherein the gas injection means includes a plurality of gas injection holes disposed at sides of the substrate-screening unit.
8 . The apparatus according to claim 1 , wherein the gas injection means is movable up and down.
9 . The apparatus according to claim 1 , wherein the substrate supporter has a third diameter smaller than the second diameter.
10 . The apparatus according to claim 9 , wherein the third diameter is smaller than or equal to the first diameter.Join the waitlist — get patent alerts
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