US2008102568A1PendingUtilityA1
Soi bipolar transistors with reduced self heating
Est. expiryJul 1, 2025(expired)· nominal 20-yr term from priority
H10D 84/401H10D 84/0109H10D 84/038H10D 86/201H10D 86/01
47
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Claims
Abstract
A method for constructing a bipolar transistor comprising a collector, a base and an emitter, all located over a substrate, the method including steps of: creating a collector layer over the substrate; etching a path through the collector layer to the substrate; and filling the path with a heat-conductive material.
Claims
exact text as granted — not AI-modified1 . A method for constructing a bipolar transistor comprising a collector, a base and an emitter, all located over a substrate, the method comprising steps of:
creating a collector layer over the substrate; etching a path through the collector layer to the substrate; and filling the path with a heat-conductive material.
2 . The method of claim 1 wherein the heat-conductive material comprises a metal.
3 . The method of claim 1 wherein the heat-conductive material comprises polysilicon.
4 . The method of claim 1 further comprising removing any excess heat-conductive material.
5 . The method of claim 1 wherein the step of depositing a collector layer comprises depositing an n-type material collector.
6 . The method of claim 1 wherein the step of depositing a collector layer comprises depositing a p-type material collector.
7 . The method of claim 1 further comprising creating an nMOS field effect transistor.
8 . The method of claim 1 further comprising creating a pMOS field effect transistor.
9 . The method of claim 1 further comprising:
locating the base over the collector; and locating the emitter over the base, such that the bipolar transistor comprises a vertical structure.
10 . The method of claim further comprising:
locating the base and the emitter in a single layer above a buried oxide layer disposed above the substrate, such that the bipolar transistor comprises a lateral structure.Join the waitlist — get patent alerts
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