US2008055817A1PendingUtilityA1
Capacitor and method for fabricating the same
Individually held — no corporate assignee on recordPriority: Dec 30, 2004Filed: Oct 24, 2007Published: Mar 6, 2008
Est. expiryDec 30, 2024(expired)· nominal 20-yr term from priority
H10D 84/813H10D 84/811H10D 84/212H10D 1/714H10B 12/00
47
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Claims
Abstract
A capacitor structure and a method of fabricating the capacitor structure wherein. The lower electrode and the upper electrode are constructed to be separated from each other by a predetermined interval and to be engaged with each other using a series of alternating ridges so that an effective surface area can increase within a limited area.
Claims
exact text as granted — not AI-modified1 . A capacitor, comprising:
a lower electrode, constructed of a first polysilicon layer patterned in a series of ridges by implanting first conductivity type impurity ions and forming a first silicide layer stacked on an upper portion of the first polysilicon layer; an upper electrode, constructed of a second polysilicon layer patterned in a series of ridges by implanting second conductivity type impurity ions and a second silicide layer stacked on an upper portion of the second polysilicon layer, the upper electrode being separated from the lower electrode by a predetermined interval and being engaged with the lower electrode; and a dielectric layer separating the lower and upper electrodes.
2 . The capacitor according to claim 1 , wherein the dielectric layer is a silicon nitride layer.
3 - 9 . (canceled)
10 . A capacitor, comprising:
a lower electrode constructed of a first polysilicon patterned in a series of ridges; an upper electrode constructed of a second polysilicon patterned in a series of ridges, the upper electrode being are separated from the lower electrode by a predetermined interval and being engaged with the lower electrode; and a dielectric layer separating the lower electrode and the upper electrode.
11 . The capacitor according to claim 10 , wherein the first polysilicon and the second polysilicon are doped with impurity ions of opposite conductivities.
12 . The capacitor according to claim 10 , the lower electrode comprising a first silicide layer stacked on the first polysilicon.
13 . The capacitor according to claim 10 , the upper electrode comprising a second silicide layer stacked on the second polysilicon.
14 . The capacitor according to claim 10 , wherein the dielectric layer is a silicon nitride layer.Join the waitlist — get patent alerts
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