US2008054291A1PendingUtilityA1
Vertical semiconductor light-emitting device and method of manufacturing the same
Est. expiryAug 31, 2026(~0.1 yrs left)· nominal 20-yr term from priority
H01S 5/183B82Y 20/00H01S 5/34333H01S 5/0217H10H 20/018
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Claims
Abstract
Provided is a vertical semiconductor light-emitting device and a method of manufacturing the same. The method may include sequentially forming a lower clad layer, an active layer, and an upper clad layer on a substrate to form a semiconductor layer and forming first electrode layers on the upper clad layer. A metal support layer may be formed on each of the first electrode layers and a trench may be formed between the first electrode layers. The substrate may be removed and a second electrode layer may be formed on the lower clad layer.
Claims
exact text as granted — not AI-modified1 . A method of manufacturing a vertical semiconductor light-emitting device, the method comprising:
sequentially forming a lower clad layer, an active layer, and an upper clad layer on a substrate to form a semiconductor layer; forming first electrode layers on the upper clad layer; forming a metal support layer on each of the first electrode layers and forming a trench between the first electrode layers; and removing the substrate and forming a second electrode layer on the lower clad layer.
2 . The method of claim 1 , wherein the substrate is a sapphire substrate.
3 . The method of claim 1 , wherein the lower clad layer and the upper clad layer include a nitrification gallium-based material.
4 . The method of claim 1 , wherein the active layer is formed of multi quantum wall (MQW) structure of InGaN/GaN.
5 . The method of claim 1 , wherein forming the metal support layer includes:
forming a seed layer on the upper clad layer and on a surface of each of the first electrode layers; forming a photoresist (PR) layer on the seed layer between the first electrode layers; forming a metal support layer on the seed layer corresponding to each of the first electrode layers; and removing the PR layer and forming a trench in a region from which the PR layer is removed.
6 . The method of claim 5 , wherein the trench is formed using a reactive ion etching (RIE) process.
7 . The method of claim 1 , wherein removing the substrate and the forming of the second electrode layer includes:
forming a filling layer including an adhesion material on the trench region and on the surface of each of the metal support layers; attaching one of glass, silicon (Si) or sapphire onto the filling layer to form a bonding layer; and removing the substrate.
8 . The method of claim 7 , wherein the filling layer is formed of wax.
9 . The method of claim 7 , wherein the filling layer is removed using acetone.
10 . The method of claim 1 , wherein the substrate is separated from the lower clad layer by irradiating laser light having a wavelength less than about 370 nm.
11 . The method of claim 7 , wherein the substrate is separated from the lower clad layer by irradiating laser light having a wavelength less than about 370 nm.
12 . The method of claim 1 , wherein the second electrode layer is an n-type conductive material.
13 . The method of claim 1 , wherein the metal support layer is formed using plasma vapor deposition (PVD) or chemical vapor deposition (CVD).
14 . A vertical semiconductor light-emitting device, comprising:
a first electrode layer on a semiconductor layer; a seed layer and a metal support layer on the first electrode layer; a second electrode layer below the semiconductor layer; and an insulating support layer that separates the vertical semiconductor light-emitting device from another vertical semiconductor light-emitting device.
15 . The vertical semiconductor light-emitting device of claim 14 , wherein the semiconductor layer includes a lower clad layer, an active layer and an upper clad layer.
16 . The vertical semiconductor light-emitting device of claim 14 , wherein the second electrode layer is an n-type conductive material.
17 . The vertical semiconductor light-emitting device of claim 14 , wherein the first electrode layer is made of a p-metal.
18 . The vertical semiconductor light-emitting device of claim 14 , wherein the metal support layer is made of one of the group including Cu, Cr, Ni, Ag, Au, Mo, Pd, W and Al.
19 . The vertical semiconductor light-emitting device of claim 14 , wherein the seed layer is used to form the metal support layer and is made of one of the group including Cr, Ti, Au and Ni.
20 . The vertical semiconductor light-emitting device of claim 14 , wherein the insulating support layer is an adhesive polymer film.Join the waitlist — get patent alerts
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