Method for positioning a probe

Abstract

A method for detecting substructure includes the steps of: nondestructively scanning an assembly using a substructure scanning system including a precision motion carriage and a nondestructive scanning sensor, positioning the assembly under the substructure scanning system, positioning the scanning sensor on the outer skin, moving the scanning sensor over the outer skin with the precision motion carriage, locating the substructure through the outer skin, and controlling an assembly process using the location of the substructure. By using the method of the present invention substructure features may be located through an outer skin with sufficient accuracy to control assembly operations and to meet engineering tolerances. The method for precisely detecting substructure using precision eddy current scanning may be used for, but is not limited to, the location of substructure features, such as edges of flanges, machined steps, or tooling holes, covered by outer mold line skins of an aircraft airframe.

1 . A method for precisely positioning and moving a probe, comprising the steps of: 
 enclosing a two-dimensional area using a frame;    inserting a first probe positioner including a first opening into said frame, wherein said first probe positioner is movable in y-direction within said frame;    inserting a second probe positioner including a second opening into said frame, wherein said first probe positioner is movable in x-direction within said frame, and wherein said second probe positioner is located above said first probe positioner;    forming a window with said first opening and with said second opening;    inserting a probe into said window;    positioning said probe on said two-dimensional area using said first probe positioner and said second probe positioner to position; and    moving said probe across said two-dimensional area in an x-y raster mode using said first probe positioner and said second probe positioner to move.    
   
   
       2 . The method for precisely positioning and moving a probe of  claim 1 , further comprising the steps of: 
 extending said first probe positioner across said frame in x-direction;    extending said second probe positioner across said frame in y-direction; and    forming a right angle with said first probe positioner and with said second probe positioner.    
   
   
       3 . The method for precisely positioning and moving a probe of  claim 1 , further comprising the step of: 
 selecting said probe from a variety of nondestructive scanning sensors.    
   
   
       4 . The method for precisely positioning and moving a probe of  claim 1 , further comprising the step of: 
 inserting an eddy current scanning sensor into said window.    
   
   
       5 . The method for precisely positioning and moving a probe of  claim 1 , further comprising the steps of: 
 scanning said two-dimensional area by moving said probe across said area in an x-y raster mode;    line scanning said area in x-direction by moving said probe within said first opening; and    line scanning said area in y-direction by moving said probe within said second opening.    
   
   
       6 . The method for precisely positioning and moving a probe of  claim 1 , further comprising the steps of: 
 connecting said first probe positioner and said second probe positioner with a computer interface; and    controlling the movement of said first probe positioner and said second probe positioner with scanning control software integrated in said computer interface.