US2008016277A1PendingUtilityA1
Dram hierarchical data path
Est. expiryApr 18, 2025(expired)· nominal 20-yr term from priority
G11C 11/4085G11C 11/4097G11C 11/4091
40
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Claims
Abstract
A hierarchical DRAM array, DRAM macro and logic chip including the DRAM macro embedded in the logic. DRAM array columns are segmented with a small number (e.g., 2-64) of cells connected to a local bit line (LBL) in each segment. Each LBL drives a sense device that drives a global read bit line (GRBL). When a cell storing a high is selected, the cell drives the LBL high, which turns the sense device on to drive the GRBL low. Segments may be used individually (as a macro) or combined with other segments sharing a common GRBL.
Claims
exact text as granted — not AI-modified1 . A DRAM array comprising:
a plurality of rows of DRAM cells, each of said rows being selected by a word line; and a plurality of columns of said DRAM cells, each of said columns comprising:
a plurality of column segments, each of said column segments including DRAM cells in two or more of said plurality of rows connected to a local bit line, a clamp device selectively gated by a hold enable and connected at a conduction terminal to said local bit line and a sense/read device gated by said local bit line, said clamp device being gated off when one of said DRAM cells is selected, and
a global bit line connected at a conduction terminal to said sense/read device, contents on each said local bit line being coupled to said global bit line.
2 - 4 . (canceled)
5 . A DRAM as in claim 1 , wherein each said clamp device is connected between said local bit line and a supply line.
6 . A DRAM as in claim 1 , wherein DRAM is a CMOS DRAM and two or more rows is less than 65 rows.
7 . (canceled)
8 . A DRAM as in claim 1 , wherein each said read device is connected between said local bit line and a virtual ground.
9 . A DRAM as in claim 8 , further comprising a virtual ground device connected between each said virtual ground and ground, said virtual ground device selectively connecting said each virtual ground to ground.
10 . A CMOS DRAM macro comprising:
a local bit line; at least two DRAM cells connected to said local bit line; a clamp device selectively gated by a hold enable and connected at a conduction terminal to said local bit line, said clamp device being gated off when one of said at least two DRAM cells is selected; a sense/read device gated by said local bit line; and a global read bit line connected to a conduction terminal of said global read bit line.
11 . A CMOS DRAM as in claim 10 , wherein the at least two DRAM cells is less than 65 DRAM cells.
12 - 19 . (canceled)
20 . A CMOS DRAM as in claim 10 , wherein each said read device is connected between said local bit line and a virtual ground.
21 . A CMOS DRAM as in claim 20 , further comprising a virtual ground device connected between each said virtual ground and ground, said virtual ground device selectively connecting said each virtual ground to ground.
22 . A CMOS logic chip including an embedded DRAM array, said embedded DRAM array comprising:
a plurality of rows of DRAM cells, each of said rows being selected by a word line; a plurality of columns of said DRAM cells, each of said columns including a plurality of column segments, each of said column segments comprising:
a local bit line, at least two DRAM cells connected to said local bit line,
a clamp device selectively gated by a hold enable and connected at a conduction terminal to said local bit line, said clamp device being gated off when one of said at least two DRAM cells is selected, and
a sense/read device gated by said local bit line; and
a global read bit line in each column, read devices in said column segments in said each column being connected at a conduction terminal to said global read bit line.
23 . A CMOS logic chip as in claim 22 , wherein the at least two DRAM cells is less than 65 DRAM cells.
24 - 32 . (canceled)
33 . A DRAM as in claim 5 , wherein said supply line is a ground line.Join the waitlist — get patent alerts
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