US2007284746A1PendingUtilityA1
Nano-electrode-array for integrated circuit interconnects
Est. expiryNov 15, 2024(expired)· nominal 20-yr term from priority
H10W 20/044H10W 20/041H10W 20/035H10W 20/034H10W 20/033Y10S977/723
48
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Claims
Abstract
An integrated circuit is provided including an integrated circuit having a trench and via provided in a dielectric layer. A nano-electrode-array is over the dielectric layer in the trench and via, and a conductor is over the nano-electrode-array. The conductor and the nano-electrode-array are coplanar with a surface of the dielectric layer.
Claims
exact text as granted — not AI-modified1 . An integrated circuit comprising:
a dielectric layer having a trench and via provided therein; a nano-electrode-array over the dielectric layer in the trench and via; a conductor over the nano-electrode-array; and the conductor and the nano-electrode-array coplanar with a surface of the dielectric layer.
2 . The integrated circuit as claimed in claim 1 further comprising:
a barrier layer on the dielectric layer in the trench and via; and the nano-electrode-array on the barrier layer.
3 . The integrated circuit as claimed in claim 1 further comprising:
a self-assembly monolayer on the dielectric layer in the trench and via; and the nano-electrode-array at least partially embedded in the self-assembly monolayer.
4 . The integrated circuit as claimed in claim 1 wherein:
the nano-electrode-array is on the dielectric layer from which a self-assembly monolayer has been removed.
5 . The integrated circuit as claimed in claim 1 further comprising:
a metallization on the nano-electrode array.
6 . An integrated circuit comprising:
an integrated circuit having a trench and via provided in a dielectric layer; a nano-electrode-array characteristic of activation or electroless deposition over the dielectric layer in the trench and via; a conductor characteristic of electroless deposition or electroplating over the nano-electrode-array; and the conductor and the nano-electrode-array planarized by electrochemical, chemical, or chemical-mechanical polishing to be coplanar with a surface of the dielectric layer.
7 . The integrated circuit as claimed in claim 6 further comprising:
a barrier layer on the dielectric layer in the trench and via; and the nano-electrode-array on the barrier layer; and the conductor on the nano-electrode-array.
8 . The integrated circuit as claimed in claim 6 further comprising:
a self-assembly monolayer having a radical or tether connection to the dielectric layer in the trench and via; the dielectric layer being of a porous low dielectric constant material; and the nano-electrode-array at least partially embedded in the self-assembly monolayer.
9 . The integrated circuit as claimed in claim 6 further comprising:
a self-assembly monolayer having a radical or tether connection to the dielectric layer in the trench and via, the dielectric layer being of a porous low dielectric constant material; at least one of the radical, the tether connection, or the combination thereof missing from the self-assembly monolayer; and the nano-electrode-array on the dielectric layer from which the radical, the tether connection, or the combination thereof of the self-assembly monolayer has been removed.
10 . The integrated circuit as claimed in claim 6 further comprising:
a metallization containing a barrier material on the nano-electrode array, the barrier material characterized by electroless deposition.Join the waitlist — get patent alerts
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