Semiconductor device and semiconductor integrated circuit

Abstract

semiconductor device includes a first nonvolatile memory element group which includes a plurality of first nonvolatile memory elements programmed with data by electrically and irreversibly varying device characteristics, a verify circuit which detects a defective first nonvolatile memory element in the first nonvolatile memory element group, and a second nonvolatile memory element group which includes a plurality of second nonvolatile memory elements programmed with data by electrically and irreversibly varying device characteristics and which stores address data to rescue the defective first nonvolatile memory element.

1 . A semiconductor device comprising: 
 a first electrical fuse group configured to store data, and including a plurality of first electrical fuses which are electrically programmable;    a verify circuit configured to detect a defective first electrical fuse in the first electrical fuse group; and    a second electrical fuse group configured to store address data used to rescue the defective first electrical fuse, and including a plurality of second electrical fuses which are electrically programmable.    
   
   
       2 . The semiconductor device according to  claim 1 , wherein: 
 the first electrical fuse group has 2 n  (n: integer) electrical fuses, and    the second electrical fuse group has n second electrical fuses and is programmable with the address data having n bits.    
   
   
       3 . The semiconductor device according to  claim 1 , wherein the first electrical fuse group is configured to transfer the stored data to a logic circuit.  
   
   
       4 . The semiconductor device according to  claim 1 , wherein the first electrical fuse group is configured to transfer the stored data to a memory.