Semiconductor integrated circuit

Abstract

There is provided a fuse module that holds trimming information for an internal oscillation circuit module. The fuse module includes information-writing fuse circuits to which trimming information is written depending on whether an information-writing fuse is blown; a reference fuse circuit for determining whether the information-writing fuse has been blown; and a current-to-voltage converter section. Since the reference fuse circuit and the current-to-voltage converter section are shared by the information-writing fuse circuits, the circuit area of the fuse module is greatly reduced.

1 - 6 . (canceled)  
   
   
       7 . A semiconductor integrated circuit, comprising: 
 a control circuit holding a plurality of bits of control information,    wherein the control circuit includes:    a control-information writing circuit that outputs the control information for each bit in response to a first control signal;    a reference circuit that outputs reference information in response to a second control signal;    a comparison circuit that compares the control information for each bit output from the control-information writing circuit to the reference information output from the reference circuit; and    a register circuit which stores control information output from the comparison circuit.    
   
   
       8 . The semiconductor integrated circuit according to  claim 7 , 
 wherein the comparison circuit compares the control information to the reference information to determine whether the bit of control information is higher or lower than the reference information.    
   
   
       9 . The semiconductor integrated circuit according to  claim 7 , 
 wherein the control-information writing circuit includes a plurality of fuses which are equal to the number of bits of the control information.    
   
   
       10 . The semiconductor integrated circuit according to  claim 9 , 
 wherein the control-information writing circuit includes first switches which are equal in number to the fuses, and which are coupled between the fuses and the comparison circuit, for switching in response to the first control signal.    
   
   
       11 . The semiconductor integrated circuit according to  claim 10 , 
 wherein the reference circuit includes a reference fuse for determining whether control information is in the fuses and a second switch coupled between the reference fuse and the comparison circuit, for switching in response to the second control signal.    
   
   
       12 . The semiconductor integrated circuit according to  claim 11 , 
 wherein the reference fuse is common to the plurality of the fuses of the control-information writing circuit.    
   
   
       13 . The semiconductor integrated circuit according to  claim 11 , 
 wherein the fuses and the reference fuse are electric fuses which are blown by applying voltage.    
   
   
       14 . The semiconductor integrated circuit according to  claim 9 , 
 wherein the reference circuit is common to the plurality of the fuses of the control-information writing circuit.