Cleanup method for optics in immersion lithography
Abstract
An immersion lithography apparatus has a reticle stage arranged to retain a reticle, a working stage arranged to retain a workpiece, and an optical system including an illumination source and an optical element opposite the workpiece for having an image pattern of the reticle projected by radiation from the illumination source. A gap is defined between the optical element and the workpiece, and a fluid-supplying device serves to supply an immersion liquid into this gap such that the supplied immersion liquid contacts both the optical element and the workpiece during an immersion lithography process. A cleaning device is incorporated for removing absorbed liquid from the optical element during a cleanup process. The cleaning device may make use of a cleaning liquid having affinity to the absorbed liquid, heat, a vacuum condition, ultrasonic vibrations or cavitating bubbles for the removal of the absorbed liquid. The cleaning liquid may be supplied through the same fluid-applying device provided with a switching device such as a valve.
Claims
exact text as granted — not AI-modified1 . A lithographic apparatus, comprising:
a substrate table configured to hold a substrate; a projection system configured to project a patterned beam of radiation onto the substrate, the projection system comprising a final optical element adjacent the substrate; a liquid supply system configured to provide a liquid to a space between the projection system and the substrate table; and a cleaning device configured to clean the final optical element, the substrate table, or both.
2 . The apparatus according to claim 1 , wherein the cleaning device comprises a liquid confinement structure of the liquid supply system, the cleaning device configured to clean the final optical element in-line in the lithographic apparatus.
3 . The apparatus according to claim 1 , wherein the cleaning device comprises an ultrasonic transmitter configured to turn liquid in the space into an ultrasonic cleaning liquid.
4 . The apparatus according to claim 1 , wherein the cleaning device comprises an optical element configured to supply low wavelength ultraviolet radiation.
5 . The apparatus according to claim 4 , wherein the liquid supply system comprises a surface that is transparent to the low wavelength ultraviolet radiation.
6 . The apparatus according to claim 4 , wherein the low wavelength ultraviolet radiation has a wavelength of about 193 nm.
7 . The apparatus according to claim 1 , wherein the cleaning device is configured to supply a cleaning fluid to the space.
8 . The apparatus according to claim 7 , wherein the cleaning fluid comprises a solvent.
9 . The apparatus according to claim 7 , wherein the cleaning fluid comprise a detergent.
10 . The apparatus according to claim 7 , wherein the cleaning fluid comprises a dissolved gas.
11 . The apparatus according to claim 10 , wherein the gas is selected from oxygen, ozone or nitrogen.
12 . The apparatus according to claim 1 , wherein the cleaning device is in the substrate table.
13 . The apparatus according to claim 12 , wherein the cleaning device comprises a spray unit.
14 . The apparatus according to claim 13 , wherein the spray unit is configured to spray a cleaning fluid onto the optical element, the substrate table, or both.
15 . The apparatus according to claim 14 , wherein the cleaning fluid comprises ozone.
16 . The apparatus according to claim 14 , wherein the cleaning fluid comprises plasma.
17 . The apparatus according to claim 14 , wherein the cleaning fluid comprises liquid carbon dioxide.
18 . The apparatus according to claim 14 , wherein the cleaning fluid comprises a non-polar organic solvent.
19 . The apparatus according to claim 14 , wherein the cleaning fluid comprises a polar organic solvent.
20 . The apparatus according to claim 14 , wherein the cleaning device is configured to clean only the final optical element or to clean only the substrate table.
21 . A lithographic apparatus, comprising:
a substrate table configured to hold a substrate; a projection system configured to project a patterned beam of radiation onto the substrate, the projection system comprising a final optical element adjacent the substrate; a liquid supply system configured to provide a liquid to a space between the projection system and the substrate table; and a coater configured to coat the final optical element, the substrate table, or both.
22 . The apparatus according to claim 21 , wherein the coater comprises a spray unit in the substrate table.
23 . The apparatus according to claim 21 , wherein the coater comprises a liquid confinement structure of the liquid supply system, the coating device configured to coat the final optical element in-line in the lithographic apparatus.
24 . The apparatus according to claim 21 , wherein the coating device is configured to coat only the final optical element or to clean only the substrate table.
25 . The use of a fluid supply system in a lithographic apparatus for the in-line application of (i) a cleaning fluid, (ii) a coating fluid, (iii) a coating remover, or (iv) any combination of (i)-(iii), to a space between a projection system and a substrate table of the lithographic apparatus.
26 . A spray unit configured to spray a cleaning fluid onto a final optical element of a lithographic apparatus projection system.
27 . An ultrasonic emitter configured to turn a liquid confined in a space between a projection system and a substrate table of lithographic apparatus into an ultrasonic cleaning liquid.
28 . A method of cleaning a projection system optical element, a substrate table, or both, in a lithographic apparatus configured to have a liquid in a space between the optical element and the substrate table, the method comprising circulating a cleaning fluid through the space.
29 . A method of coating a projection system optical element, a substrate table, or both, in a lithographic apparatus configured to have a liquid in a space between the optical element and the substrate table, the method comprising circulating a coating fluid through the space.Join the waitlist — get patent alerts
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