Wafer storage container and apparatus
Abstract
An injection molded container for storing and transporting wafers includes a base having a wafer area upon which to place a stack of a plurality of wafer assemblies, wherein each wafer assembly includes a wafer frame upon which is mounted a wafer. A protective wall structure is positioned around the wafer area, and includes at least one wall contour artifact. Each wafer frame according to the invention includes a corresponding opposite/mating artifact. The wall structure and wafer frame are configured so that the wafer frame must be oriented to mate the wall and frame artifacts in order for the wafer frame to be installed in the container.
Claims
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19 . A wafer storage container for storing a plurality of wafer elements comprising:
a storage chamber that includes a base and a wall structure extending from the base; at least one orientation artifact disposed on the wall structure; wherein an orientation artifact is asymmetrical to ensure that any wafer element inserted into the storage chamber has a predetermined orientation.
20 . The wafer storage container of claim 19 , further comprising a plurality of columns attached to an interior portion of the wall structure.
21 . The wafer storage container of claim 20 , wherein said plurality of columns are located perpendicular to the plane of the base.
22 . The wafer storage container of claim 19 wherein the storage chamber is substantially round.
23 . A wafer storage apparatus for storing a plurality of wafer elements comprising:
a substantially round storage chamber having a wall extending from a base; a cover; one or more orientation artifacts disposed on a wall of the storage chamber; a plurality of wafer elements, each wafer element having at least one alignment artifact thereon that engages to one of the orientation artifacts of the storage chamber, wherein the orientation of the wafer elements is known when the cover is removed from the storage chamber.
24 . The wafer storage apparatus of claim 23 wherein the orientation artifacts are asymmetrical to each other to ensure that each wafer element has only a single orientation.
25 . The wafer storage apparatus of claim 23 wherein the wall of the storage chamber comprises a plurality of sections.
26 . The wafer storage apparatus of claim 23 wherein the wall of the storage chamber is a continuous structure.
27 . The wafer storage apparatus of claim 23 wherein a portion of the wall of the storage chamber includes a draft angle.
28 . The wafer storage apparatus of claim 23 wherein a plurality of columns protrude from the inner perimeter of the storage chamber.
29 . The wafer storage apparatus of claim 23 wherein the plurality of wafer elements comprise wafers or wafers secured to a wafer frame.
30 . The wafer storage apparatus of claim 23 wherein the alignment artifact of each wafer element contacts an orientation artifact within the wafer storage chamber to enable the orientation of each wafer element to be determined.
31 . A wafer storage apparatus for storing a plurality of wafer elements comprising:
a storage chamber including a base and a wall extending from the base, said chamber having an interior width that is wider at an upper region than at a lower region adjacent to the base; at least one orientation artifact disposed on a portion of said wall of the storage chamber; a plurality of wafer elements, each wafer element having at least one alignment artifact thereon that engages to one of the orientation artifacts of the storage chamber.
32 . The wafer storage apparatus of claim 31 , wherein the storage chamber is substantially round.
33 . The wafer storage apparatus of claim 31 wherein the plurality of wafer elements comprise wafers or wafers secured to a wafer frame.
34 . The wafer storage apparatus of claim 31 wherein a plurality of columns protrude from the inner perimeter of the storage chamber.
35 . The wafer storage apparatus of claim 31 wherein the alignment artifact of each wafer element contacts an orientation artifact within the wafer storage chamber to enable the orientation of each wafer element to be determined.Join the waitlist — get patent alerts
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